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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 1 — Jan. 9, 2006
  • pp: 216–221

Diffraction-suppressed high-resolution imaging through metallodielectric nanofilms

Simin Feng and J. Merle Elson  »View Author Affiliations


Optics Express, Vol. 14, Issue 1, pp. 216-221 (2006)
http://dx.doi.org/10.1364/OPEX.14.000216


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Abstract

We show that diffraction-suppressed propagation of light can be achieved in one-dimensional multilayer metal-dielectric structure, leading to high-resolution imaging through metallodielectric nanofilms.

© 2006 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(100.6640) Image processing : Superresolution
(110.0110) Imaging systems : Imaging systems
(230.4170) Optical devices : Multilayers
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons
(260.3910) Physical optics : Metal optics
(310.6860) Thin films : Thin films, optical properties
(350.0350) Other areas of optics : Other areas of optics
(350.5500) Other areas of optics : Propagation

ToC Category:
Metamaterials

Citation
Simin Feng and J. Merle Elson, "Diffraction-suppressed high-resolution imaging through metallodielectric nanofilms," Opt. Express 14, 216-221 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-1-216


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