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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 1 — Jan. 9, 2006
  • pp: 229–234

White light on-axis digital holographic microscopy based on spectral phase shifting

Daesuk Kim, Jang Woo You, and Soohyun Kim  »View Author Affiliations

Optics Express, Vol. 14, Issue 1, pp. 229-234 (2006)

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A white light on-axis digital holographic microscopy based on spectral phase shifting is described. We show experimentally that the spectral phase shifting based on-axis digital holographic microscopy can be used as an alternative to the PZT based phase shifting digital holographic microscopy. The proposed spectral phase shifting approach can provide a speckle-free capability since it employs the partial coherent source produced by combining a white light source and a spectral tunable filter. Another benefit of the proposed white light on-axis digital holographic microscopic system stemmed from spectral phase shifting approach is in the capability of providing a full color 3-D spectral section imaging.

© 2006 Optical Society of America

OCIS Codes
(090.1760) Holography : Computer holography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation

ToC Category:

Virtual Issues
Vol. 1, Iss. 2 Virtual Journal for Biomedical Optics

Daesuk Kim, Jang Woo You, and Soohyun Kim, "White light on-axis digital holographic microscopy based on spectral phase shifting," Opt. Express 14, 229-234 (2006)

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  1. A. W. Lohmann, "How to make computer holograms: Development in holography," Seminar Proc. SPIE, 43-49 (1971).
  2. U. Schnars and W. Juptner, "Direct recording of holograms by a CCD target and numerical reconstruction," Appl. Opt. 33, 179-181 (1994). [CrossRef] [PubMed]
  3. E. Cuche, F. Bevilacqua and C. Depeursinge, "Digital holography for quantitative phase-contrast imaging," Opt. Lett. 24, 291-293 (1999). [CrossRef]
  4. Y. Takaki, H Kawai, and H. Ohzu, "Hybrid holographic microscopy free of conjugate and zero-order images," Appl. Opt. 38, 4990-4996 (1999). [CrossRef]
  5. T. M. Kreis, W. P. O. Juptner, "Suppression of the dc term in digital holography," Opt. Eng. 36, 2357-2360 (1997). [CrossRef]
  6. N. Demoli, J. Mestrovic, and I. Sovic, "Subtraction digital holography," Appl. Opt. 42, 798-804 (2003). [CrossRef] [PubMed]
  7. Y. Zhang, G. Pedrini, W. Osten, and H. J. Tiziani, "Whole optical wave field reconstruction from double or multi in-line holograms by phase retrieval algorithm," Opt. Express 11, 3234-3241 (2003), <a href= "http://www.opticsexpress.org/abstract.cfm?URI=OPEX-11-24-3234">http://www.opticsexpress.org/abstract.cfm?URI=OPEX-11-24-3234</a>. [CrossRef] [PubMed]
  8. I. Yamaguchi and T. Zhang, "Phase-shifting digital holography," Opt. Lett. 22, 1268-1270 (1997). [CrossRef] [PubMed]
  9. T. Zhang and I. Yamaguchi, "Three-dimensional microscopy with phase-shifting digital holography," Opt. Lett. 23, 1221-1223 (1998). [CrossRef]
  10. F. Dubois, L. Joannes and J. Legros, "Improved three-dimensional imaging with a digital holography microscope with a source of partial spatial coherence," Appl. Opt. 38, 7085-7094 (1999). [CrossRef]
  11. Y. Ishii, J. Chen, and K. Murata, "Digital phase-measuring interferometry with a tunable laser diode," Opt. Lett. 12, 233-235 (1988). [CrossRef]
  12. F. Le Clerc, L. Collet, and M. Gross, "Numerical heterodyne holography with two-dimensional photodetector arrays," Opt. Lett. 25, 716-718 (2000). [CrossRef]
  13. G. Pedrini, and H. J. Tiziani, "Short-coherence digital microscopy by use of a lensless holographic imaging system," Appl. Opt. 41, 4489-4496 (2002). [CrossRef] [PubMed]
  14. D. Kim and S. Kim, "Direct spectral phase calculation for dispersive interferometric thickness profilometry" Opt. Express 12, 5117-5124 (2004), <a href= "http://www.opticsexpress.org/abstract.cfm?URI=OPEX-12-21-5117">http://www.opticsexpress.org/abstract.cfm?URI=OPEX-12-21-5117</a>. [CrossRef] [PubMed]
  15. M. Takeda, and H. Yamamoto, "Fourier-transform speckle profilometry: three dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces," Appl. Opt. 33, 7829-7837 (1994). [CrossRef] [PubMed]
  16. I. Yamaguchi, "Surface tomography by wavelength scanning interferometry," Opt. Eng. 39, 40-46 (2000). [CrossRef]

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