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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 1 — Jan. 9, 2006
  • pp: 298–305

Micro displacement sensor based on line-defect resonant cavity in photonic crystal

Zhenfeng Xu, Liangcai Cao, Claire Gu, Qingsheng He, and Guofan Jin  »View Author Affiliations

Optics Express, Vol. 14, Issue 1, pp. 298-305 (2006)

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A micro displacement sensor and its sensing technique based on line-defect resonant cavity in photonic crystals (PhCs) are presented. The line-defect resonant cavity is formed by a fixed and a mobile PhC segments. With a proper operating frequency, a quasi-linear measurement of micro-displacement is achieved with sensitivity of 1.15 a-1 (a is the lattice constant) and Q factor of 40. The sensitivity can be adjusted easily by varying either Q factor or operating frequency of the sensing system. In addition, the sensing range can be broadened to -0.55 a ~0.60 a by using multiple operating frequencies. The properties of the micro displacement sensor are analyzed theoretically and simulated using finite-difference time-domain (FDTD) method.

© 2006 Optical Society of America

OCIS Codes
(230.3990) Optical devices : Micro-optical devices
(250.5300) Optoelectronics : Photonic integrated circuits

ToC Category:
Optical Devices

Zhenfeng Xu, Liangcai Cao, Claire Gu, Qingsheng He, and Guofan Jin, "Micro displacement sensor based on line-defect resonant cavity in photonic crystal," Opt. Express 14, 298-305 (2006)

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