Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks
Optics Express, Vol. 14, Issue 10, pp. 4452-4458 (2006)
http://dx.doi.org/10.1364/OE.14.004452
Enhanced HTML 
Acrobat PDF (553 KB)
Abstract
Conductive-atomic force microscopy has been successfully used for characterizing recorded marks on commercial digital versatile disk and Blu-ray disk. Nano recorded marks beyond diffraction limit are imaged with high spatial resolution and excellent contrast of conductivity. The smallest mark size resolved is around 23.5 nm which is limited by background spots around 18.5 nm. The results of different optical power and writing strategy on the size, shape, and close packed writing process of recorded marks clearly show the opto-thermal response of phase-change recording layer.
© 2006 Optical Society of America
OCIS Codes
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording
ToC Category:
Optical Data Storage
History
Original Manuscript: February 27, 2006
Revised Manuscript: May 5, 2006
Manuscript Accepted: May 6, 2006
Published: May 15, 2006
Citation
Shih Kai Lin, I Chun Lin, and Din Ping Tsai, "Characterization of nano recorded marks at different writing strategies on phase-change recording layer of optical disks," Opt. Express 14, 4452-4458 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-10-4452
Sort: Year | Journal | Reset
References
- T. Ohta, K. Nishiuchi, K. Narumi, Y. Kitaoka, H. Ishibashi, N. Yamada, and T. Kozaki, "Overview and the future of phase-change optical disk technology," Jpn. J. Appl. Phys. 39,770-774 (2000). [CrossRef]
- R. Saito, F. Ito, Y. Yokochi, T. Saito, T. Ohira, H. Sato, and M. Itonaga, "Polarization-free Blu-ray disc/digital versatile disc compatible optical pick-up," Jpn. J. Appl. Phys. 43,4799-4800 (2004). [CrossRef]
- Blu-ray disk 23GB, SONY, 6-7-35 Kitashinagawa, Shinagawa-ku, Tokyo 141-0001, Japan.
- J. Tominaga, T. Nakano, and N. Atoda, "An approach for recording and readout beyond the diffraction limit with an Sb thin film," Appl. Phys. Lett. 73,2078-2080 (1998). [CrossRef]
- T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, and W. C. Lin, "Micro-optical nonlinearity of a silver oxide layer," J. Appl. Phys. 89,6139-6145 (2001). [CrossRef]
- D. P. Tsai and W. C. Lin, "Probing the near fields of the super-resolution near-field optical structure," Appl. Phys. Lett. 77,1413-1415 (2000). [CrossRef]
- W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, and D. P. Tsai, "Near-field images of the super-resolution near-field structure," Appl. Phys. Lett. 78,685-687 (2001). [CrossRef]
- W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. Y. Wen, K. H. Chen, and D. P. Tsai, "Study of a super-resolution optical structure: polycarbonate /ZnS-SiO2 /ZnO /ZnS-SiO2 /Ge2Sb2Te5 /ZnS-SiO2", Jpn. J. Appl. Phys. 42, part 1, 1029-1030 (2003). [CrossRef]
- T. Tadokoro, T. Saiki, K. Yusu, and K. Ichihara, "High-resolution examination of recording marks in phase-change media using as scanning near-field optical microscope," Jpn. J. Appl. Phys. 39,3599-3602 (2000). [CrossRef]
- T. Kikukawa and H. Utsunomiya, "Scanning probe microscope observation of recorded marks in phase change disks," Microsc. Microanal. 7,363-367 (2001). [CrossRef]
- T. Luoh, J.-S. Bow, A. Peng, S.-Y. Tsai, and M.-R. Tseng, "Observation of recording marks in phase-change media using scanning electron microscopy channeling contrast image," Jpn. J. Appl. Phys. 38,1698-1700 (1999). [CrossRef]
- M. Miyamoto, A. Hirotsune, Y. Miyauchi, K. Ando, M. Terao, N. Tokusyuku, and R. Tamura, "Analysis of mark-formation process for phase-change media," IEEE J. Quantum Electron. 4,826-831 (1998). [CrossRef]
- B. J. Kooi, W. M. G. Groot and J. Th. M. De Hosson, "In situ transmission electron microscopy study of the crystallization of Ge2Sb2Te5," J. Appl. Phys. 95,924-932 (2004). [CrossRef]
- 4X DVD+RW for data and video 4.7GB 120min, RITEK, 42, Kuan-Fu N. Road, Hsin-Chu Industrial Park, 30316, Taiwan.
- C. Peng, L. Cheng, and M. Mansuripur, "Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media," J. Appl. Phys. 82,4183-4191 (1999). [CrossRef]
- E. R. Meinders, H. J. Borg, M. H. R. Lankhorst, J. Hellmig, and A. V. Mijiritskii, "Numerical simulation of mark formation in dual-stack phase-change recording," J. Appl. Phys. 91,9794-9802 (2002). [CrossRef]
Cited By |
 Alert me when this paper is cited |
OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.
Related Journal Articles 
- Differential Time Detection for Radial Tracking of Optical Disks (AO)
- Interlayer Cross Talk in Dual-Layer Read-Only Optical Disks (AO)
- Optical Tunneling Effect Calculation of a Solid Immersion Lens for use in Optical Disk Memory (AO)
- Evaluation of Partial-Response Maximum-Likelihood Detection for Phase-Change Optical Data Storage (AO)
- Measurement of the Thermal Conductivity of Erasable Phase-Change Optical Recording Media (AO)
Related Conference Papers
- Study on 200 Mbps High Speed Write/Read using a Phase-Change Write-Once Disk
- Thermal analysis of super-resolution near-field phase change optical disk
- 15 Gbit/in2 recording on a DWDD disc using a land/groove substrate with a red laser enabled by a side-wall-annealing process
- Anneal-less DWDD for 15 Gbit/in2 land-groove recording using a deep groove substrate and a red laser
- Inorganic write-once disc with quadruple recording layers for the Blu-ray disc system
« Previous Article | Next Article »
OSA is a member of 