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Terahertz response of GaN thin films
Tsong-Ru Tsai, Shi-Jie Chen, Chih-Fu Chang, Sheng-Hsien Hsu, Tai-Yuan Lin, and Cheng-Chung Chi »View Author Affiliations
Institute of Optoelectronic Sciences, National Taiwan Ocean University, Keelung, Taiwan 20224, R.O.C.
Department of Physics and Materials Science Center, National Tsing Hua University, and The Center for Nano Science and Technology, University System of Taiwan, Hsinchu, Taiwan 300, R.O.C.
Optics Express, Vol. 14, Issue 11, pp. 4898-4907 (2006)
http://dx.doi.org/10.1364/OE.14.004898
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Abstract
The indices of refraction, extinction constants and complex conductivities of the GaN film for frequencies ranging from 0.2 to 2.5 THz are obtained using THz time-domain spectroscopy. The results correspond well with the Kohlrausch stretched exponential model. Using the Kohlrausch model fit not only provides the mobility of the free carriers in the GaN film, but also estimates the relaxation time distribution function and average relaxation time.
© 2006 Optical Society of America
OCIS Codes
(300.6270) Spectroscopy : Spectroscopy, far infrared
(310.6860) Thin films : Thin films, optical properties
ToC Category:
Thin Films
History
Original Manuscript: March 9, 2006
Revised Manuscript: May 5, 2006
Manuscript Accepted: May 22, 2006
Published: May 29, 2006
Citation
Tsong-Ru Tsai, Shi-Jie Chen, Chih-Fu Chang, Sheng-Hsien Hsu, Tai-Yuan Lin, and Cheng-Chung Chi, "Terahertz response of GaN thin films," Opt. Express 14, 4898-4907 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-11-4898
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References
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- M. Tyagi, A. Alegria, and J. Colmenero, "Heterogeneous dynamics of poly(vinyl acetate) far above Tg:A combined study by dielectric spectroscopy and quasielastic neutron scattering," J. Chem. Phys. 122, 2449091-24490913 (2005). [CrossRef]
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- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
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- A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, "Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry," Phys. Rev. B 62, 7365-7377 (2000). [CrossRef]
- K. T. Tsen, R. P. Joshi, D. K. Ferry, A. Botchkarev, B. Sverdlov, A. Salvador, and H. Morkoc, "Nonequilibrium electron distributions and phonon dynamics in wurtzite GaN," Appl. Phys. Lett. 68, 2990-2992 (1996). [CrossRef]
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- W. Zhang, A. K. Azad, and D. Grischkowsky, "Terahertz studies of carrier dynamics and dielectric response of n-type, freestanding epitaxial GaN," Appl. Phys. Lett. 82, 2841-2843 (2003). [CrossRef]
- T. I. Jeon, and D. Grischkowsky, "Nature of conduction in doped silicon," Phys. Rev. Lett. 78, 1106-1109 (1997). [CrossRef]
- D. Grischkowsky, S. R. Keiding, M. van Exter, and Ch. Fattinger, "Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors," J. Opt. Soc. Am. B 7, 2006-2015 (1990). [CrossRef]
- D. C. Reynolds, D. C. Look, B. Jogai, A. W. Saxler, S. S. Park, and J. Y. Hahn, "A giant magnetoresistance sensor for high magnetic field measurements," Appl. Phys. Lett. 77, 1879-1881 (2000). [CrossRef]
- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
- W. J. Moore, J. A. Freitas, Jr., S. K. Lee, S. S. Park, and J. Y. Han, "Magneto-optical studies of free-standing hydride-vapor-phase epitaxial GaN," Phys. Rev. B 65, 081201 (2002). [CrossRef]
- T. Nagashima, K. Takata, S. Nashima, H. Harima, and M. Hangyo, "measurement of electrical properties of GaN thin films using terahertz-time domain spectroscopy," Jpn. J. Appl. Phys., 44, 926-931 (2005). [CrossRef]
- T. Nagashima, K. Takata, S. Nashima, H. Harima, and M. Hangyo, "measurement of electrical properties of GaN thin films using terahertz-time domain spectroscopy," Jpn. J. Appl. Phys., 44, 926-931 (2005). [CrossRef]
- A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, "Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry," Phys. Rev. B 62, 7365-7377 (2000). [CrossRef]
- A. S. Barker, Jr. and M. Ilegems, "Infrared Lattice Vibrations and Free-Electron Dispersion in GaN," Phys. Rev. B 7, 743-750 (1973). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, Y. Sugimoto, and H. Kiyoku, "Room-temperature continuous-wave operation of InGaN multi-quantum-well structure laser diodes with a lifetime of 27 hours," Appl. Phys. Lett. 70, 1417-1419 (1997). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, "InGaN-based multi-quantum-well-structure laser diodes," Jpn. J. Appl. Phys., 35, L74-L76 (1996). [CrossRef]
- T. I. Jeon, and D. Grischkowsky, "Nature of conduction in doped silicon," Phys. Rev. Lett. 78, 1106-1109 (1997). [CrossRef]
- D. D. Chen, M. Smith, J. Y. Lin, H. X. Jiang, S. H. Wei, M. A. Khan, and C. J. Sun, "Fundamental optical transitions in GaN," Appl. Phys. Lett. 68, 2784-2786 (1996). [CrossRef]
- D. C. Reynolds, B. Jogai, and T. C. Collins, "Longitudinal Excitons in GaN," Appl. Phys. Lett. 80, 3928-3930 (2002). [CrossRef]
- D. C. Reynolds, D. C. Look, B. Jogai, A. W. Saxler, S. S. Park, and J. Y. Hahn, "A giant magnetoresistance sensor for high magnetic field measurements," Appl. Phys. Lett. 77, 1879-1881 (2000). [CrossRef]
- K. T. Tsen, R. P. Joshi, D. K. Ferry, A. Botchkarev, B. Sverdlov, A. Salvador, and H. Morkoc, "Nonequilibrium electron distributions and phonon dynamics in wurtzite GaN," Appl. Phys. Lett. 68, 2990-2992 (1996). [CrossRef]
- A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, "Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry," Phys. Rev. B 62, 7365-7377 (2000). [CrossRef]
- K. S. Ramaiah, Y. K. Su, S. J. Chang, B. Kerr, H. P. Liu, and I. G. Chen, "Characterization of InGaN/GaN multi-quantum-well blue-light-emitting diodes grown by metal organic chemical vapor deposition," Appl. Phys. Lett. 84, 3307-3309 (2004). [CrossRef]
- R. Gaska, J. W. Yang, A. Osinsky, Q. Chen, M. A. Khan, A. O. Orlov, G. L. Snider, and M. S. Shur, "Electron transport in AlGaN-GaN heterostructures grown on 6H-SiC substrates," Appl. Phys. Lett. 72, 707-709 (1998). [CrossRef]
- D. D. Chen, M. Smith, J. Y. Lin, H. X. Jiang, S. H. Wei, M. A. Khan, and C. J. Sun, "Fundamental optical transitions in GaN," Appl. Phys. Lett. 68, 2784-2786 (1996). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, Y. Sugimoto, and H. Kiyoku, "Room-temperature continuous-wave operation of InGaN multi-quantum-well structure laser diodes with a lifetime of 27 hours," Appl. Phys. Lett. 70, 1417-1419 (1997). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, "InGaN-based multi-quantum-well-structure laser diodes," Jpn. J. Appl. Phys., 35, L74-L76 (1996). [CrossRef]
- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
- D. I. Florescu, J. C. Ramer, D. S. Lee, and E. A. Armour, "InGaN/GaN single-quantum-well light-emitting diodes optical output efficiency dependence on the properties of the barrier layer separating the active and p-layer regions," Appl. Phys. Lett. 84, 5252-5254 (2004). [CrossRef]
- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
- W. J. Moore, J. A. Freitas, Jr., S. K. Lee, S. S. Park, and J. Y. Han, "Magneto-optical studies of free-standing hydride-vapor-phase epitaxial GaN," Phys. Rev. B 65, 081201 (2002). [CrossRef]
- D. D. Chen, M. Smith, J. Y. Lin, H. X. Jiang, S. H. Wei, M. A. Khan, and C. J. Sun, "Fundamental optical transitions in GaN," Appl. Phys. Lett. 68, 2784-2786 (1996). [CrossRef]
- H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, "Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies," J. Appl. Phys. 76, 1363-1398 (1994). [CrossRef]
- C. P. Lindsey and G. D. Patterson, "Detailed comparison of the Williams-Watts and Cole-Davidson functions," J. Chem. Phys. 73, 3348-3357 (1980). [CrossRef]
- K. S. Ramaiah, Y. K. Su, S. J. Chang, B. Kerr, H. P. Liu, and I. G. Chen, "Characterization of InGaN/GaN multi-quantum-well blue-light-emitting diodes grown by metal organic chemical vapor deposition," Appl. Phys. Lett. 84, 3307-3309 (2004). [CrossRef]
- D. C. Reynolds, D. C. Look, B. Jogai, A. W. Saxler, S. S. Park, and J. Y. Hahn, "A giant magnetoresistance sensor for high magnetic field measurements," Appl. Phys. Lett. 77, 1879-1881 (2000). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, Y. Sugimoto, and H. Kiyoku, "Room-temperature continuous-wave operation of InGaN multi-quantum-well structure laser diodes with a lifetime of 27 hours," Appl. Phys. Lett. 70, 1417-1419 (1997). [CrossRef]
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, "InGaN-based multi-quantum-well-structure laser diodes," Jpn. J. Appl. Phys., 35, L74-L76 (1996). [CrossRef]
- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
- A. Yasan, R. McClintock, K. Mayes, S. R. Darvish, H. Zhang, P. Kung, M. Razeghi, S. K. Lee, and J. Y. Han, "Comparison of ultraviolet light-emitting diodes with peak emission at 340 nm grown on GaN substrate and sapphire," Appl. Phys. Lett. 81, 2151-2153 (2002). [CrossRef]
- X. A. Cao, J. M. Teetsov, M. P. D'Evelyn, D. W. Merfeld, and C. H. Yan, "Electrical characteristics of InGaN/GaN light-emitting diodes grown on GaN and sapphire substrates," Appl. Phys. Lett. 85, 7-9 (2004). [CrossRef]
- W. J. Moore, J. A. Freitas, Jr., S. K. Lee, S. S. Park, and J. Y. Han, "Magneto-optical studies of free-standing hydride-vapor-phase epitaxial GaN," Phys. Rev. B 65, 081201 (2002). [CrossRef]
- K. T. Tsen, R. P. Joshi, D. K. Ferry, A. Botchkarev, B. Sverdlov, A. Salvador, and H. Morkoc, "Nonequilibrium electron distributions and phonon dynamics in wurtzite GaN," Appl. Phys. Lett. 68, 2990-2992 (1996). [CrossRef]
- H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, "Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies," J. Appl. Phys. 76, 1363-1398 (1994). [CrossRef]
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