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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 13 — Jun. 26, 2006
  • pp: 5945–5953

Transversal ultrahigh-resolution polarization-sensitive optical coherence tomography for strain mapping in materials

K. Wiesauer, M. Pircher, E. Götzinger, C. K. Hitzenberger, R. Engelke, G. Ahrens, G. Grützner, and D. Stifter  »View Author Affiliations


Optics Express, Vol. 14, Issue 13, pp. 5945-5953 (2006)
http://dx.doi.org/10.1364/OE.14.005945


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Abstract

Optical coherence tomography (OCT) and its extension, polarization-sensitive (PS-)OCT, are techniques for contactless and non-destructive imaging of internal structures. In this work, we apply PS-OCT for material characterization. We use a transversal scanning, ultra-high resolution (UHR-)PS-OCT setup providing cross-sectional as well as in-plane information about the internal microstructure, the birefringence and the orientation of the optical axis within the material. We perform structural analysis and strain-mapping for different samples: we show the necessity of UHR imaging for a highly strained elastomer sample, and we discuss the effect of large birefringence on the PS-OCT images. Furthermore, we investigate high-aspect ratio photoresist moulds for the production of micro-electromechanical parts (MEMS), demonstrating that transversal UHR-PS-OCT is a promising tool for non-destructive strain-mapping.

© 2006 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.5440) Optical devices : Polarization-selective devices

ToC Category:
Imaging Systems

History
Original Manuscript: April 21, 2006
Revised Manuscript: June 12, 2006
Manuscript Accepted: June 12, 2006
Published: June 26, 2006

Virtual Issues
Vol. 1, Iss. 7 Virtual Journal for Biomedical Optics

Citation
K. Wiesauer, M. Pircher, E. Goetzinger, C. K. Hitzenberger, R. Engelke, G Ahrens, G. Gruetzner, and D. Stifter, "Transversal ultrahigh-resolution polarizationsensitive optical coherence tomography for strain mapping in materials," Opt. Express 14, 5945-5953 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-13-5945


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