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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 13 — Jun. 26, 2006
  • pp: 5994–6000

Distortion induced effects on the finesse of high-performance large-aperture Fabry-Perot etalon filters

J. Zhang, J. W. Arkwright, and D. I. Farrant  »View Author Affiliations

Optics Express, Vol. 14, Issue 13, pp. 5994-6000 (2006)

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The effect of thickness uniformity and distortion on the performance of large-aperture Fabry-Perot etalon filters is investigated. It is shown that for etalons currently being used for solar observation it is important to consider the effect of distortion due to mounting and to gravity when in use. It is further shown that the effects of distortion can be largely avoided by operating the etalon at or near normal incidence.

© 2006 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(220.4610) Optical design and fabrication : Optical fabrication

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: April 13, 2006
Revised Manuscript: June 2, 2006
Manuscript Accepted: June 6, 2006
Published: June 26, 2006

J. Zhang, J. W. Arkwright, and D. I. Farrant, "Distortion induced effects on the finesse of high-performance large-aperture Fabry-Perot etalon filters," Opt. Express 14, 5994-6000 (2006)

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  2. C. D. Prasad, S. K. Mathew, A. Bhatnagar, and A Ambastha, "Solar photospheric and chromospheric observations using a lithium niobate Fabry-Perot etalon," Exp. Astron. 8, 125-133, (1998). [CrossRef]
  3. J. Arkwright, I. Underhill, N. Pereira, and M. Gross, "Deterministic control of thin film thickness in physical vapor deposition systems using a multi-aperture mask," Opt. Express 13, 2731-2741 (2005). [CrossRef] [PubMed]
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