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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 15 — Jul. 24, 2006
  • pp: 6788–6793

White-light interference microscopy: a way to obtain high lateral resolution over an extended range of heights

Maitreyee Roy, Colin J. R. Sheppard, Guy Cox, and Parameswaran Hariharan  »View Author Affiliations

Optics Express, Vol. 14, Issue 15, pp. 6788-6793 (2006)

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A problem with conventional techniques of interference microscopy, when profiling surfaces with an extended range of heights, is that only points on a single plane are in sharp focus. Other points, which are higher or lower, may be out of focus, with a consequent loss of lateral resolution. We show that white-light interference microscopy, with an achromatic phase-shifter, makes it possible to produce a three-dimensional representation of such surfaces with high lateral resolution over the entire range of heights.

© 2006 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(170.1650) Medical optics and biotechnology : Coherence imaging
(180.3170) Microscopy : Interference microscopy
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:

Original Manuscript: May 4, 2006
Revised Manuscript: July 5, 2006
Manuscript Accepted: July 6, 2006
Published: July 24, 2006

Virtual Issues
Vol. 1, Iss. 8 Virtual Journal for Biomedical Optics

Maitreyee Roy, Colin J. R. Sheppard, Guy Cox, and Parameswaran Hariharan, "White-light interference microscopy: a way to obtain high lateral resolution over an extended range of heights," Opt. Express 14, 6788-6793 (2006)

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