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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 17 — Aug. 21, 2006
  • pp: 7889–7894

X-ray ultramicroscopy using integrated sample cells

Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, and Eric Hanssen  »View Author Affiliations

Optics Express, Vol. 14, Issue 17, pp. 7889-7894 (2006)

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The X-ray ultramicroscope (XuM), based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. The right-angle-type integrated sample cells described here expand the capabilities of the XuM technique. The integrated sample cell combines a target, a spacer, a sample chamber, and an exit window in one physical unit, thereby simplifying the instrumentation and providing increased mechanical stability. The XuM imaging results presented here, obtained using such right-angle integrated sample cells, clearly demonstrate the ability to characterize very small features in objects, down to of order 100nm, including their use for dry, wet and even liquid samples.

© 2006 Optical Society of America

OCIS Codes
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy

ToC Category:

Original Manuscript: June 20, 2006
Revised Manuscript: August 3, 2006
Manuscript Accepted: August 3, 2006
Published: August 21, 2006

Virtual Issues
Vol. 1, Iss. 9 Virtual Journal for Biomedical Optics

Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, and Eric Hanssen, "X-ray ultramicroscopy using integrated sample cells," Opt. Express 14, 7889-7894 (2006)

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