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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 18 — Sep. 4, 2006
  • pp: 8459–8469

M-lines characterization of selenide and telluride waveguides for mid-infrared interferometry

Lucas Labadie, Caroline Vigreux-Bercovici, Annie Pradel, Pierre Kern, Brahim Arezki, and Jean-Emmanuel Broquin  »View Author Affiliations

Optics Express, Vol. 14, Issue 18, pp. 8459-8469 (2006)

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Nulling interferometry is an astronomical technique that combines equal wavefronts to achieve a deep rejection ratio of an on-axis star, and that could permit to detect Earth-like planets in the mid-infrared band [5 – 20 μm]. Similarly to what is done in the near-infrared, high frequencies spatial filtering of the incoming beams can be achieved using single-mode waveguides operating in the mid-infrared. An appreciable reduction of the instrumental complexity is also possible using integrated optics (IO) devices in this spectral range. The relative lack of single-mode guided optics in the mid-infrared has motivated the present technological study to demonstrate the feasibility of dielectric waveguides functioning at longer wavelengths. We propose to use selenide and telluride components to pursue the development of more complex IO functions.

© 2006 Optical Society of America

OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(130.3060) Integrated optics : Infrared
(310.3840) Thin films : Materials and process characterization

ToC Category:
Thin Films

Original Manuscript: May 4, 2006
Revised Manuscript: August 6, 2006
Manuscript Accepted: August 6, 2006
Published: September 1, 2006

Lucas Labadie, Caroline Vigreux-Bercovici, Annie Pradel, Pierre Kern, Brahim Arezki, and Jean-Emmanuel Broquin, "M-lines characterization of selenide and telluride thick films for mid-infrared interferometry," Opt. Express 14, 8459-8469 (2006)

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