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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 19 — Sep. 18, 2006
  • pp: 8706–8715

Correction of diffraction effects in confocal Raman microspectroscopy

A. Gallardo, R. Navarro, H. Reinecke, and S. Spells  »View Author Affiliations


Optics Express, Vol. 14, Issue 19, pp. 8706-8715 (2006)
http://dx.doi.org/10.1364/OE.14.008706


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Abstract

A mathematical approach developed to correct depth profiles of wet-chemically modified polymer films obtained by confocal Raman microscopy is presented which takes into account scattered contributions originated from a diffraction-limited laser focal volume. It is demonstrated that the problem can be described using a linear Fredholm integral equation of the first kind which correlates apparent and true Raman intensities with the depth resolution curve of the instrument.The calculations of the corrected depth profiles show that considerable differences between apparent and corrected depth profiles exist at the surface, especially when profiles with strong concentration gradients are dealt with or an instrument with poor depth resolution is used. Degrees of modification at the surface obtained by calculation of the corrected depth profiles are compared with those measured by FTIR-ATR and show an excellent concordance.

© 2006 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(180.1790) Microscopy : Confocal microscopy
(300.6450) Spectroscopy : Spectroscopy, Raman

ToC Category:
Microscopy

History
Original Manuscript: May 18, 2006
Revised Manuscript: July 26, 2006
Manuscript Accepted: July 27, 2006
Published: September 18, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Citation
A. Gallardo, R. Navarro, H. Reinecke, and S. Spells, "Correction of diffraction effects in confocal Raman microspectroscopy," Opt. Express 14, 8706-8715 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-19-8706


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