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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 19 — Sep. 18, 2006
  • pp: 8706–8715

Correction of diffraction effects in confocal Raman microspectroscopy

A. Gallardo, R. Navarro, H. Reinecke, and S. Spells  »View Author Affiliations

Optics Express, Vol. 14, Issue 19, pp. 8706-8715 (2006)

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A mathematical approach developed to correct depth profiles of wet-chemically modified polymer films obtained by confocal Raman microscopy is presented which takes into account scattered contributions originated from a diffraction-limited laser focal volume. It is demonstrated that the problem can be described using a linear Fredholm integral equation of the first kind which correlates apparent and true Raman intensities with the depth resolution curve of the instrument.The calculations of the corrected depth profiles show that considerable differences between apparent and corrected depth profiles exist at the surface, especially when profiles with strong concentration gradients are dealt with or an instrument with poor depth resolution is used. Degrees of modification at the surface obtained by calculation of the corrected depth profiles are compared with those measured by FTIR-ATR and show an excellent concordance.

© 2006 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(180.1790) Microscopy : Confocal microscopy
(300.6450) Spectroscopy : Spectroscopy, Raman

ToC Category:

Original Manuscript: May 18, 2006
Revised Manuscript: July 26, 2006
Manuscript Accepted: July 27, 2006
Published: September 18, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

A. Gallardo, R. Navarro, H. Reinecke, and S. Spells, "Correction of diffraction effects in confocal Raman microspectroscopy," Opt. Express 14, 8706-8715 (2006)

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  1. K. L. Mittal, and K. W. Lee, Polymer Surfaces and Interfaces: Characterization Modification and Application, VSP: (Utrecht, 1997).
  2. J. Sacristán, C. Mijangos, and H. Reinecke, "Surface modification of PVC films in solvent-non-solvent mixtures," Polymer 41, 5577 (2000). [CrossRef]
  3. J. Sacristán, C. Mijangos, S. Spells, J. Yarwood, and H. Reinecke, "Selective surface modification of PVC films as revealed by confocal Raman microspectroscopy," Macromolecules 33, 6134 (2000). [CrossRef]
  4. R. Tabaksblat, J. Meier, and B. J. Kip, "Confocal Raman Microspectroscopy: Theory and Application to Thin Polymer Samples"Appl. Spectrosc. 46, 60 (1992). [CrossRef]
  5. J. Sacristán, C. Mijangos, H. Reinecke, S. J. Spells, and J. Yarwood, "Surface modification of Polystyrene films. Depth profiling and mapping by Raman microscopy" Macromol. Chem. Phys. 203, 678 (2002). [CrossRef]
  6. H. Reinecke, S. Spells, J. Sacristán, C. Mijangos, and J. Yarwood, "Confocal Raman depth profiling of surface modified polymer films. Effect of sample refractive index," Appl. Spectrosc. 55, 1660(2001). [CrossRef]
  7. G. D. McAnally, N. J. Everall, J. M. Chalmers, and W. E. Smith, "Analysis of Thin Film Coatings on Poly(ethylene terephthalate) by Confocal Raman Microscopy and Surface-Enhanced Raman Scattering," Appl. Spectrosc. 57, 44 (2003). [CrossRef] [PubMed]
  8. W. Schrof, E. Beck, G. Etzrodt, H. Hintze-Brüning, U. Meisenburg, R. Schwalm, and J. Warming, "Depth-resolved characterization of UV cured coatings by confocal Raman and two-photon microscopy," Progress in Organic Coatings 43, 1 (2001). [CrossRef]
  9. O. S. Fleming, and S. G. Kazarian," Appl. Spectrosc. 58, 390 (2004). [CrossRef] [PubMed]
  10. . G. W. M. Peters, A. N. Zdravkov, and H. E. H. Meijer, "Transient interfacial tension and dilatational rheology of diffuse polymer-polymer interfaces," J. Chem. Phys. 122, 104901 (2005). [CrossRef] [PubMed]
  11. W. Schrof, J. Klingler, W. Heckmann, and D. Horn "Confocal fluorescence and Raman microscopy in industrial research." Colloid and Polymer Science 276, 577 (1998). [CrossRef]
  12. N. J. Everall, "Modelling and Measuring the effect of refraction on the depth resolution of confocal Raman Spectroscopy" Appl. Spectrosc. 54, 773 (2000). [CrossRef]
  13. N. J. Everall, "Confocal Raman microscopy: why the depth resolution and spatial accuracy can be much worse than you think," Appl. Spectrosc. 54, 1515 (2000). [CrossRef]
  14. S. Michielsen, "Aberrations in confocal spectroscopy of polymeric materials: erroneous thicknesses and intensities, and loss of resolution," J. Appl. Polym. Sci. 81, 1662 (2001). [CrossRef]
  15. F. M. Mirabella, "Internal reflection spectroscopy," Appl Spectrosc. Rev. 21, 45 (1985). [CrossRef]
  16. A. Gallardo, S. Spells, R. Navarro, H. Reinecke, "Confocal Raman microspectroscopy: calculation of corrected depth profiles of wet-chemically modified polymer films." Macromol. Rapid Commun. 27, 529 (2006). [CrossRef]

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