Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance
Optics Express, Vol. 14, Issue 19, pp. 8745-8752 (2006)
http://dx.doi.org/10.1364/OE.14.008745
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Abstract
We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si3N4 or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.
© 2006 Optical Society of America
OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(130.3120) Integrated optics : Integrated optics devices
(170.4520) Medical optics and biotechnology : Optical confinement and manipulation
(180.5810) Microscopy : Scanning microscopy
(230.3990) Optical devices : Micro-optical devices
(230.5750) Optical devices : Resonators
ToC Category:
Optical Devices
History
Original Manuscript: August 11, 2006
Revised Manuscript: September 10, 2006
Manuscript Accepted: September 11, 2006
Published: September 18, 2006
Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics
Citation
W. C. L. Hopman, K. O. van der Werf, A. J. F. Hollink, W. Bogaerts, V. Subramaniam, and R. M. de Ridder, "Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance," Opt. Express 14, 8745-8752 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-19-8745
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