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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 19 — Sep. 18, 2006
  • pp: 8866–8884

Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures

Dong Hun Park, Chi H. Lee, and Warren N. Herman  »View Author Affiliations


Optics Express, Vol. 14, Issue 19, pp. 8866-8884 (2006)
http://dx.doi.org/10.1364/OE.14.008866


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Abstract

We present new closed-form expressions for analysis of Teng-Man measurements of the electro-optic coefficients of poled polymer thin films. These expressions account for multiple reflection effects using a rigorous analysis of the multilayered structure for varying angles of incidence. The analysis based on plane waves is applicable to both transparent and absorptive films and takes into account the properties of the transparent conducting electrode layer. Methods for fitting data are presented and the error introduced by ignoring the transparent conducting layer and multiple reflections is discussed.

© 2006 Optical Society of America

OCIS Codes
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: July 5, 2006
Revised Manuscript: August 31, 2006
Manuscript Accepted: September 1, 2006
Published: September 18, 2006

Citation
Dong H. Park, Chi H. Lee, and Warren N. Herman, "Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures," Opt. Express 14, 8866-8884 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-19-8866


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