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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 20 — Oct. 2, 2006
  • pp: 9006–9015

Characterization of porous core layer for controlling rare earth incorporation in optical fiber

Anirban Dhar, Mukul Ch. Paul, Mrinmay Pal, Ashok Kr. Mondal, Suchitra Sen, Himadri Sekhar Maiti, and Ranjan Sen  »View Author Affiliations

Optics Express, Vol. 14, Issue 20, pp. 9006-9015 (2006)

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The porous core layer deposited by modified chemical vapour deposition process has been analyzed in terms of thickness, pore size distribution, homogeneity and characteristics of the soot particles to investigate their variation with deposition temperature and input vapour composition. The compositions selected were SiO2, SiO2-GeO2 and SiO2-P2O5. Rare earth ions were incorporated into the deposit by a solution doping technique. The analysis of deposited microstructures was found to provide a quantitative indication about the rare earth incorporation and its variation with respect to process conditions. Thus the characterization provides a method of controlling rare earth doping and ultimate preform/fiber properties.

© 2006 Optical Society of America

OCIS Codes
(060.2280) Fiber optics and optical communications : Fiber design and fabrication
(060.2410) Fiber optics and optical communications : Fibers, erbium

ToC Category:
Fiber Optics and Optical Communications

Original Manuscript: June 9, 2006
Revised Manuscript: August 14, 2006
Manuscript Accepted: August 27, 2006
Published: October 2, 2006

Anirban Dhar, Mukul Ch. Paul, Mrinmay Pal, Ashok Kr. Mondal, Suchitra Sen, Himadri S. Maiti, and Ranjan Sen, "Characterization of porous core layer for controlling rare earth incorporation in optical fiber," Opt. Express 14, 9006-9015 (2006)

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