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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 20 — Oct. 2, 2006
  • pp: 9156–9168

Analytical design of an Offner imaging spectrometer

X. Prieto-Blanco, C. Montero-Orille, B. Couce, and R. de la Fuente  »View Author Affiliations

Optics Express, Vol. 14, Issue 20, pp. 9156-9168 (2006)

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We present the analytical design of an imaging spectrometer based on the three-concentric-mirror (Offner) configuration. The approach presented allows for the rapid design of this class of system. Likewise, high-optical-quality spectrometers are obtained without the use of aberration-corrected gratings, even for high speeds. Our approach is based on the calculation of both the meridional and the sagittal images of an off-axis object point. Thus, the meridional and sagittal curves are obtained in the whole spectral range. Making these curves tangent to each other for a given wavelength results in a significant decrease in astigmatism, which is the dominant residual aberration. RMS spot radii less than 5 µm are obtained for speeds as high as f/2.5 and a wavelength range of 0.41.0 µm. A design example is presented using a free interactive optical design tool.

© 2006 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(220.1000) Optical design and fabrication : Aberration compensation
(220.4830) Optical design and fabrication : Systems design

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 15, 2006
Revised Manuscript: August 18, 2006
Manuscript Accepted: August 21, 2006
Published: October 2, 2006

X. Prieto-Blanco, C. Montero-Orille, B. Couce, and R. de la Fuente, "Analytical design of an Offner imaging spectrometer," Opt. Express 14, 9156-9168 (2006)

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