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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 20 — Oct. 2, 2006
  • pp: 9169–9177

Azimuthal position error correction algorithm for absolute test of large optical surfaces

Hyug-Gyo Rhee, Yun-Woo Lee, and Seung-Woo Kim  »View Author Affiliations

Optics Express, Vol. 14, Issue 20, pp. 9169-9177 (2006)

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Absolute test needs test part rotation to separate errors of the interferometer itself from errors due to the test surfaces. At this time, previous absolute test algorithms assume no azimuthal position error during part rotation. For large optics whose diameters are 0.6 m and over, however, exact rotations are physically difficult. Motivated by this, we propose a new algorithm that adopts least squares technique to determine the true azimuthal positions of part rotation and consequently eliminates testing errors caused by rotation inaccuracy.

© 2006 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 22, 2006
Revised Manuscript: September 14, 2006
Manuscript Accepted: September 21, 2006
Published: October 2, 2006

Hyug-Gyo Rhee, Yun-Woo Lee, and Seung-Woo Kim, "Azimuthal position error correction algorithm for absolute test of large optical surfaces," Opt. Express 14, 9169-9177 (2006)

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