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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 20 — Oct. 2, 2006
  • pp: 9178–9187

Calibration-based two-frequency projected fringe profilometry: a robust, accurate, and single-shot measurement for objects with large depth discontinuities

Wei-Hung Su and Hongyu Liu  »View Author Affiliations


Optics Express, Vol. 14, Issue 20, pp. 9178-9187 (2006)
http://dx.doi.org/10.1364/OE.14.009178


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Abstract

An improved method is proposed to perform calibration-based fringe projected profilometry using a two-frequency fringe pattern for the 3D shape measurements of objects with large discontinuous height steps. A fabrication scheme for the two-frequency pattern is described as well. The proposed method offers following major advantages: (1) only one phase measurement needed for operation, (2) easiness for calibration, (3) robust performance, especially for automatic phase unwrapping, and (4) more flexible data acquisition for complex objects. This makes it possible for a single-shot measurement of dynamic objects with discontinuities. Both theoretical descriptions and experimental demonstrations are provided.

© 2006 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 14, 2006
Revised Manuscript: September 25, 2006
Manuscript Accepted: September 25, 2006
Published: October 2, 2006

Citation
Wei-Hung Su and Hongyu Liu, "Calibration-based two-frequency projected fringe profilometry: a robust, accurate, and single-shot measurement for objects with large depth discontinuities," Opt. Express 14, 9178-9187 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-20-9178


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