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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 22 — Oct. 30, 2006
  • pp: 10171–10180

Optics InfoBase > Optics Express > Volume 14 > Issue 22 > Page 10171

Application of a beam homogenizer to planar laser diagnostics

Sebastian Pfadler, Frank Beyrau, Micha Löffler, and Alfred Leipertz  »View Author Affiliations


Optics Express, Vol. 14, Issue 22, pp. 10171-10180 (2006)
http://dx.doi.org/10.1364/OE.14.010171


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Abstract

The first application of a microlens array beam homogenizer to planar laser measurement techniques in combustion diagnostics is demonstrated. The beam homogenizing properties of two microlens arrays in combination with a Fourier lens for widespread applications are presented. An uniform line profile with very little temporal fluctuations of the spatial intensity distribution was generated resulting in a significant reduction of measurement noise and enabling an easier and faster signal processing.

© 2006 Optical Society of America

OCIS Codes
(030.4280) Coherence and statistical optics : Noise in imaging systems
(100.0100) Image processing : Image processing
(120.1740) Instrumentation, measurement, and metrology : Combustion diagnostics
(140.3300) Lasers and laser optics : Laser beam shaping
(300.2530) Spectroscopy : Fluorescence, laser-induced
(300.6450) Spectroscopy : Spectroscopy, Raman

ToC Category:
Coherence and Statistical Optics

History
Original Manuscript: August 1, 2006
Revised Manuscript: October 5, 2006
Manuscript Accepted: October 16, 2006
Published: October 30, 2006

Citation
Sebastian Pfadler, Frank Beyrau, Micha Löffler, and Alfred Leipertz, "Application of a beam homogenizer to planar laser diagnostics," Opt. Express 14, 10171-10180 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-22-10171


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References

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