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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 22 — Oct. 30, 2006
  • pp: 10596–10602

Near-field optical imaging with a CdSe single nanocrystal-based active tip

Y. Sonnefraud, N. Chevalier, J.-F. Motte, S. Huant, P. Reiss, J. Bleuse, F. Chandezon, M. T. Burnett, W. Ding, and S. A. Maier  »View Author Affiliations

Optics Express, Vol. 14, Issue 22, pp. 10596-10602 (2006)

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We report near-field scanning optical imaging with an active tip made of a single fluorescent CdSe nanocrystal attached at the apex of an optical tip. Although the images are acquired only partially because of the random blinking of the semiconductor particle, our work validates the use of such tips in ultra-high spatial resolution optical microscopy.

© 2006 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(260.2510) Physical optics : Fluorescence
(330.6130) Vision, color, and visual optics : Spatial resolution

ToC Category:

Original Manuscript: July 11, 2006
Revised Manuscript: September 5, 2006
Manuscript Accepted: September 22, 2006
Published: October 30, 2006

Virtual Issues
Vol. 1, Iss. 11 Virtual Journal for Biomedical Optics

Y. Sonnefraud, N. Chevalier, J.-F. Motte, S. Huant, P. Reiss, J. Bleuse, F. Chandezon, M. T. Burnett, W. Ding, and S. A. Maier, "Near-field optical imaging with a CdSe single nanocrystal-based active tip," Opt. Express 14, 10596-10602 (2006)

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