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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 24 — Nov. 27, 2006
  • pp: 11598–11607

Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)

Basanta Bhaduri, N. Krishna Mohan, M. P. Kothiyal, and R.S. Sirohi  »View Author Affiliations

Optics Express, Vol. 14, Issue 24, pp. 11598-11607 (2006)

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Digital speckle pattern interferometry (DSPI) and digital shearography (DS) are well known optical tools for qualitative as well as quantitative measurements of displacement components and its derivatives of engineering structures subjected either static or dynamic load. Spatial phase shifting (SPS) technique is useful for extracting quantitative displacement data from the system with only two frames. Optical configurations for DSPI and DS with a double aperture mask in front of the imaging lens for spatial phase shifting are proposed in this paper for the measurement of out-of-plane displacement and its first order derivative (slope) respectively. An error compensating four-phase step algorithm is used for quantitative fringe analysis.

© 2006 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: July 5, 2006
Revised Manuscript: November 16, 2006
Manuscript Accepted: November 16, 2006
Published: November 27, 2006

Basanta Bhaduri, N. K. Mohan, M. P. Kothiyal, and R. S. Sirohi, "Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)," Opt. Express 14, 11598-11607 (2006)

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