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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 25 — Dec. 11, 2006
  • pp: 12432–12438

Reliability in the oxide vertical-cavity surface-emitting lasers exposed to electrostatic discharge

Hee-Dae Kim, Weon-Guk Jeong, Hyun-Ee Shin, Jung-Hoon Ser, Hyun-Kuk Shin, and Young-Gu Ju  »View Author Affiliations


Optics Express, Vol. 14, Issue 25, pp. 12432-12438 (2006)
http://dx.doi.org/10.1364/OE.14.012432


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Abstract

Electrostatic discharge(ESD) damage is known as a major source affecting the lifetime of oxide VCSEL. We investigated how ESD damage threshold voltage depends on the size, thickness, and composition of the oxide aperture by measuring the change of output power and reverse leakage current after ESD. ESD damage threshold voltage increased with the size of the oxide aperture, regardless of the thickness and the composition of the oxide aperture. However, damaged devices with thinner oxide layers showed relatively longer lifetime in the reliability test. The reliability data also showed that the VCSELs exposed to ESD have steeper power declines in reliability test than normal devices. This may be due to the defects formed in the active medium by ESD.

© 2006 Optical Society of America

OCIS Codes
(140.5960) Lasers and laser optics : Semiconductor lasers
(250.7260) Optoelectronics : Vertical cavity surface emitting lasers

ToC Category:
Optoelectronics

History
Original Manuscript: July 14, 2006
Revised Manuscript: November 26, 2006
Manuscript Accepted: November 29, 2006
Published: December 11, 2006

Citation
Hee-Dae Kim, Weon-Guk Jeong, Hyun-Ee Shin, Jung-Hoon Ser, Hyun-Kuk Shin, and Young-Gu Ju, "Reliability in the oxide vertical-cavity surface-emitting lasers exposed to electrostatic discharge," Opt. Express 14, 12432-12438 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-25-12432


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References

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