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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 26 — Dec. 25, 2006
  • pp: 12744–12750

High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis

D. Reolon, M. Jacquot, I. Verrier, G. Brun, and C. Veillas  »View Author Affiliations


Optics Express, Vol. 14, Issue 26, pp. 12744-12750 (2006)
http://dx.doi.org/10.1364/OE.14.012744


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Abstract

In this paper we propose group refractive index measurement with a spectral interferometric set-up using a broadband supercontinuum generated in an air-silica Microstructured Optical Fibre (MOF) pumped with a picosecond pulsed microchip laser. This source authorizes high fringes visibility for dispersion measurements by Spectroscopic Analysis of White Light Interferograms (SAWLI). Phase calculation is assumed by a wavelet transform procedure combined with a curve fit of the recorded channelled spectrum intensity. This approach provides high resolution and absolute group refractive index measurements along one line of the sample by recording a single 2D spectral interferogram without mechanical scanning.

© 2006 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(290.3030) Scattering : Index measurements

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 18, 2006
Manuscript Accepted: November 7, 2006
Published: December 22, 2006

Citation
David Reolon, Maxime Jacquot, Isabelle Verrier, Gérald Brun, and Colette Veillas, "High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis," Opt. Express 14, 12744-12750 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-26-12744


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References

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