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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 26 — Dec. 25, 2006
  • pp: 12976–12983

Imaging colloidal particle induced topological defects in a nematic liquid crystal using third harmonic generation microscopy

Rajesh S. Pillai, Masahito Oh-e, Hiroshi Yokoyama, G. J. Brakenhoff, and Michiel Müller  »View Author Affiliations


Optics Express, Vol. 14, Issue 26, pp. 12976-12983 (2006)
http://dx.doi.org/10.1364/OE.14.012976


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Abstract

The nature of the third-harmonic generation (THG) process in a nematic liquid crystal is investigated for the case of tightly focused, low intensity, laser beams. Colloidal particle induced topological defects in a liquid crystal are visualized in three-dimensions using the dependence of the THG signal on both changes in non-linear susceptibility and the orientation of the liquid crystal director relative to the incident laser polarization state. We have found that the interpretation of THG images in a liquid crystal is complicated not only by the change in polarisation of the electric field as it propagates through the medium but also by anisotropic refractive index mismatch induced aberrations.

© 2006 Optical Society of America

OCIS Codes
(160.3710) Materials : Liquid crystals
(180.6900) Microscopy : Three-dimensional microscopy
(190.4160) Nonlinear optics : Multiharmonic generation
(190.4410) Nonlinear optics : Nonlinear optics, parametric processes
(190.4720) Nonlinear optics : Optical nonlinearities of condensed matter

ToC Category:
Nonlinear Optics

History
Original Manuscript: October 6, 2006
Revised Manuscript: November 27, 2006
Manuscript Accepted: November 28, 2006
Published: December 22, 2006

Virtual Issues
Vol. 2, Iss. 1 Virtual Journal for Biomedical Optics

Citation
Rajesh S. Pillai, Masahito Oh-e, Hiroshi Yokoyama, G. J. Brakenhoff, and Michiel Müller, "Imaging colloidal particle induced topological defects in a nematic liquid crystal using third harmonic generation microscopy," Opt. Express 14, 12976-12983 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-26-12976


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