Electromagnetic forces for an arbitrary optical trapping of a spherical dielectric
Optics Express, Vol. 14, Issue 26, pp. 13101-13106 (2006)
http://dx.doi.org/10.1364/OE.14.013101
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Abstract
A double tweezers setup was employed to perform ultra sensitive force measurements and to obtain the full optical force curve as a function of radial position and wavelength. The light polarization was used to select either the transverse electric (TE), or transverse magnetic (TM), or both, modes excitation. Analytical solution for optical trapping force on a spherical dielectric particle for an arbitrary positioned focused beam is presented in a generalized Lorenz-Mie diffraction theory. The theoretical prediction of the theory agrees well with the experimental results. The algorithm presented here can be easily extended to other beam geometries and scattering particles.
© 2006 Optical Society of America
OCIS Codes
(140.7010) Lasers and laser optics : Laser trapping
(170.4520) Medical optics and biotechnology : Optical confinement and manipulation
(180.0180) Microscopy : Microscopy
(260.1960) Physical optics : Diffraction theory
(260.2110) Physical optics : Electromagnetic optics
(290.4020) Scattering : Mie theory
ToC Category:
Trapping
History
Original Manuscript: October 10, 2006
Revised Manuscript: December 13, 2006
Manuscript Accepted: December 14, 2006
Published: December 22, 2006
Virtual Issues
Vol. 2, Iss. 1 Virtual Journal for Biomedical Optics
Citation
Antonio A. R. Neves, Adriana Fontes, Liliana de Y. Pozzo, Andre A. de Thomaz, Enver Chillce, Eugenio Rodriguez, Luiz C. Barbosa, and Carlos L. Cesar, "Electromagnetic forces for an arbitrary optical trapping of a spherical dielectric," Opt. Express 14, 13101-13106 (2006)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-14-26-13101
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