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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 14, Iss. 4 — Feb. 20, 2006
  • pp: 1541–1546

Optical percolation and nonlinearity of sputtered Ag island films

S. Ding, X. Wang, D. J. Chen, and Q. Q. Wang  »View Author Affiliations

Optics Express, Vol. 14, Issue 4, pp. 1541-1546 (2006)

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The fractal dimension Df and the critical parameter v of the sputtered percolation Ag island films are measured to be about 1.57 and 1.15, respectively. A modified Z-scan method including both transmittance Z-scan and reflection Z-scan is proposed to measure the pure nonlinear absorption of the semi-continuous Ag films near the percolation threshold. As the microstructure of the sputtered Ag films varies from the discontinuous to the continuous, the linear absorbance decreases from 0.97 to 0.58 while the nonlinear absorption coefficient changes from -1.4×10-5m/W to -4.6×10-6m/W at the wavelength of 800nm. The largest nonlinear absorption coefficient β of the sputtered Ag films is obtained in the discontinuous film near the percolation threshold, which is mainly contributed by the large enhancement of local field of dis-continuous Ag particles.

© 2006 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(190.3970) Nonlinear optics : Microparticle nonlinear optics

ToC Category:

Original Manuscript: December 7, 2005
Manuscript Accepted: February 5, 2006
Published: February 20, 2006

S. Ding, X. Wang, D. Chen, and Q. Wang, "Optical percolation and nonlinearity of sputtered Ag island films," Opt. Express 14, 1541-1546 (2006)

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