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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 11 — May. 28, 2007
  • pp: 6857–6867

Backscattering of metallic microstructures with small defects located on flat substrates

P. Albella, F. Moreno, J.M. Saiz, and F. González  »View Author Affiliations

Optics Express, Vol. 15, Issue 11, pp. 6857-6867 (2007)

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Micron-sized structures on flat substrates supporting sub-micron defects are analyzed by means of a parameter based on integrated backscattering calculations. This analysis is performed for different particle and defect sizes, optical properties and for two different configurations (defect on the microstructure or on the substrate). Calculations in the far field are complemented by some near field results. It is shown that information about the defect (presence, size and optical properties) can be obtained from the proposed backscattering parameter.

© 2007 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(290.1350) Scattering : Backscattering
(290.5820) Scattering : Scattering measurements
(290.5850) Scattering : Scattering, particles

ToC Category:

Original Manuscript: March 30, 2007
Revised Manuscript: April 20, 2007
Manuscript Accepted: April 20, 2007
Published: May 18, 2007

P. Albella, F. Moreno, J. M. Saiz, and F. González, "Backscattering of metallic microstructures with small defects located on flat substrates," Opt. Express 15, 6857-6867 (2007)

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