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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 12 — Jun. 11, 2007
  • pp: 7642–7652

Electro-optic phase modulation in ridge waveguides of epitaxial K0.95Na0.05Ta0.71Nb0.29O3 thin films

Christian Herzog, Steffen Reidt, Gorazd Poberaj, and Peter Günter  »View Author Affiliations


Optics Express, Vol. 15, Issue 12, pp. 7642-7652 (2007)
http://dx.doi.org/10.1364/OE.15.007642


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Abstract

Electro-optic modulation at λ= 1.5 μm has been demonstrated for the first time to the best of our knowledge in a ridge waveguide phase modulator produced in cubic potassium sodium tantalate niobate thin films epitaxially grown on potassium tantalate substrates exploiting the large quadratic electro-optic Kerr coefficient of R11 = 8.2×10-17 m2/V2. The relative permittivity, Kerr coefficient, and refractive index have been evaluated for the thin film crystal and are compared to the values measured in bulk crystals. The half-wave voltage times length figure of merit of the modulator has been measured to be Vπl = 38 Vcm at room temperature.

© 2007 Optical Society of America

OCIS Codes
(160.2100) Materials : Electro-optical materials
(160.4760) Materials : Optical properties
(230.7380) Optical devices : Waveguides, channeled
(310.2790) Thin films : Guided waves
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: April 24, 2007
Revised Manuscript: May 23, 2007
Manuscript Accepted: May 23, 2007
Published: June 6, 2007

Citation
Christian Herzog, Steffen Reidt, Gorazd Poberaj, and Peter Günter, "Electro-optic phase modulation in ridge waveguides of epitaxial K0.95Na0.05Ta0.71Nb0.29O3 thin films," Opt. Express 15, 7642-7652 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-12-7642


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References

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