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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 13 — Jun. 25, 2007
  • pp: 8329–8339

Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions

D. Ausserré and M.-P. Valignat  »View Author Affiliations

Optics Express, Vol. 15, Issue 13, pp. 8329-8339 (2007)

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The fundamentals of a new high contrast technique for optical microscopy, named “Surface Enhanced Ellipsometric Contrast” (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. The surfaces are designed to become anti-reflecting when used in these conditions. They are defined by the simple equation rp + rs = 0 between their two Fresnel coefficients. Most often, this equation can be met by covering a solid surface with a single λ/4 layer with a well defined refractive index. A higher flexibility is obtained with multilayer stacks. Solutions with an arbitrary number of all-dielectric λ/4 layers are derived.

© 2007 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(240.0240) Optics at surfaces : Optics at surfaces
(260.0260) Physical optics : Physical optics
(310.0310) Thin films : Thin films

ToC Category:

Original Manuscript: December 14, 2006
Revised Manuscript: April 23, 2007
Manuscript Accepted: April 24, 2007
Published: June 18, 2007

Virtual Issues
Vol. 2, Iss. 7 Virtual Journal for Biomedical Optics

D Ausserré and M.-P. Valignat, "Surface enhanced ellipsometric contrast (SEEC) basic theory and λ/4 multilayered solutions," Opt. Express 15, 8329-8339 (2007)

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