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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 13 — Jun. 25, 2007
  • pp: 8346–8359

Heterodyne two beam Gaussian microscope interferometer

J. Mauricio Flores, Moisés Cywiak, Manuel Servín, and Lorenzo Juárez P.  »View Author Affiliations


Optics Express, Vol. 15, Issue 13, pp. 8346-8359 (2007)
http://dx.doi.org/10.1364/OE.15.008346


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Abstract

We present a novel microscope interferometric technique based on the heterodinization of two Gaussian beams for measuring roughness of optical surfaces in microscopic areas. One of the beams is used as a probe beam, focussed and reflected by the surface under test. The second beam interferes with the first beam and introduces a time varying modulating signal. The modulating light beam is obtained from the first diffraction order of a Bragg cell. The two beams are superimposed and added coherently at the sensitive plane of a photodetector that integrates the overall intensity of the beams. We show analytically that it is possible to find appropriate working conditions in which the system has a linear response. Under these conditions, the size of the probe beam at the plane of detection as well as the amplitude of the time varying signal at the output of the photodetector, are both proportional to the local vertical height of the surface under test. As a narrow bandwidth amplifier is used to detect the time varying signal the system exhibits a high signal to noise ratio. We also include experimental results of the measurement of the topography of a sample consisting in a blazed-reflecting grating.

© 2007 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(240.6700) Optics at surfaces : Surfaces

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 2, 2007
Revised Manuscript: May 10, 2007
Manuscript Accepted: June 1, 2007
Published: June 19, 2007

Citation
J. Mauricio Flores, Moisés Cywiak, Manuel Servín, and Lorenzo Juárez P., "Heterodyne two beam Gaussian microscope interferometer," Opt. Express 15, 8346-8359 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-13-8346


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