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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 15 — Jul. 23, 2007
  • pp: 9239–9247

LED-based multi-wavelength phase imaging interference microscopy

N. Warnasooriya and M. K. Kim  »View Author Affiliations

Optics Express, Vol. 15, Issue 15, pp. 9239-9247 (2007)

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LED-based multi-wavelength phase imaging interference microscopy combines phase-shifting interferometry with multi-wavelength optical phase unwrapping. This technique consists of a Michelson-type interferometer illuminated with a LED. The reference mirror is dithered for obtaining interference images at four phase quadratures, which are then combined to calculate the phase of the object surface. The 2π ambiguities are removed by repeating the experiment using two or more LEDs at different wavelengths, which yields phase images of effective wavelength much longer than the original. The resulting image is a profile of the object surface with a height resolution of several nanometers and range of several microns. The interferographic images using broadband sources are significantly less affected by coherent noise.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy

ToC Category:

Original Manuscript: May 30, 2007
Revised Manuscript: July 10, 2007
Manuscript Accepted: July 10, 2007
Published: July 12, 2007

Virtual Issues
Vol. 2, Iss. 8 Virtual Journal for Biomedical Optics

N. Warnasooriya and M. K. Kim, "LED-based multi-wavelength phase imaging interference microscopy," Opt. Express 15, 9239-9247 (2007)

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