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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 19 — Sep. 17, 2007
  • pp: 12508–12522

Optics InfoBase > Optics Express > Volume 15 > Issue 19 > Page 12508

Effect of electric field on laser induced damage threshold of multilayer dielectric gratings

J. Neauport, E. Lavastre, G. Razé, G. Dupuy, N. Bonod, M. Balas, G. de Villele, J. Flamand, S. Kaladgew, and F. Desserouer  »View Author Affiliations


Optics Express, Vol. 15, Issue 19, pp. 12508-12522 (2007)
http://dx.doi.org/10.1364/OE.15.012508


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Abstract

This paper studies gratings engraved in multilayer dielectric stacks for ultra high intensity laser compressors application. We design various grating profiles with high reflected efficiencies for 1780 l/mm multilayer dielectric gratings (MLD). Each grating is defined to exhibit a different electric field maximum value in the pillars of the grating. A damage testing facility operating at 1.053 µm, 500 fs pulse duration is used to damage test the parts manufactured from these designs. It is evidenced that for fixed incident angle and materials the damage of the grating is directly related to the electric field intensity maximum in the material, which depends on the groove profile. Laser induced damage thresholds of 5 J/cm2 are experimentally reached with very high and uniform efficiencies.

© 2007 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(140.7090) Lasers and laser optics : Ultrafast lasers
(320.2250) Ultrafast optics : Femtosecond phenomena
(350.1820) Other areas of optics : Damage

ToC Category:
Diffraction and Gratings

History
Original Manuscript: June 28, 2007
Revised Manuscript: August 8, 2007
Manuscript Accepted: August 17, 2007
Published: September 14, 2007

Citation
J. Neauport, E. Lavastre, G. Razé, G. Dupuy, N. Bonod, M. Balas, G. de Villele, J. Flamand, S. Kaladgew, and F. Desserouer, "Effect of electric field on laser induced damage threshold of multilayer dielectric gratings," Opt. Express 15, 12508-12522 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-19-12508


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