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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 20 — Oct. 1, 2007
  • pp: 12989–12994

Waveplate analyzer using binary magneto-optic rotators

Xiaojun Chen, Lianshan Yan, and X. Steve Yao  »View Author Affiliations


Optics Express, Vol. 15, Issue 20, pp. 12989-12994 (2007)
http://dx.doi.org/10.1364/OE.15.012989


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Abstract

We demonstrate a simple waveplate analyzer to characterize linear retarders using magneto-optic (MO) polarization rotators. The all-solid state device can provide highly accurate measurements for both the retardation of the waveplate and the orientation of optical axes simultaneously.

© 2007 Optical Society of America

OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 13, 2007
Revised Manuscript: September 12, 2007
Manuscript Accepted: September 23, 2007
Published: September 25, 2007

Citation
Xiaojun Chen, Lianshan Yan, and X. S. Yao, "Waveplate analyzer using binary magneto-optic rotators," Opt. Express 15, 12989-12994 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-20-12989


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References

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