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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 20 — Oct. 1, 2007
  • pp: 12989–12994

Waveplate analyzer using binary magneto-optic rotators

Xiaojun Chen, Lianshan Yan, and X. Steve Yao  »View Author Affiliations

Optics Express, Vol. 15, Issue 20, pp. 12989-12994 (2007)

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We demonstrate a simple waveplate analyzer to characterize linear retarders using magneto-optic (MO) polarization rotators. The all-solid state device can provide highly accurate measurements for both the retardation of the waveplate and the orientation of optical axes simultaneously.

© 2007 Optical Society of America

OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 13, 2007
Revised Manuscript: September 12, 2007
Manuscript Accepted: September 23, 2007
Published: September 25, 2007

Xiaojun Chen, Lianshan Yan, and X. S. Yao, "Waveplate analyzer using binary magneto-optic rotators," Opt. Express 15, 12989-12994 (2007)

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  1. D. Goldstein, Polarized light, (Second Edition, Marcel Dekker, Inc., NY, 2003).
  2. E. Collett, Polarized light: Fundamentals and Applications, (Marcel Dekker, New York, 1993) pp. 100-103.
  3. H. G. Jerrard, "Optical compensators for measurement of elliptical polarization," J. Opt. Soc. Am. 38, 35-59 (1948).
  4. D. H. Goldstein, "Mueller matrix dual-rotating retarder polarimeter," Appl. Opt. 31, 6676-6683 (1992).
  5. E. Dijkstra, H. Meekes, and M. Kremers, "The high-accuracy universal polarimeter," J. Phys. D 24, 1861-1868 (1991).
  6. P. A. Williams, A. H. Rose, and C. M. Wang, "Rotating-polarizer polarimeter for accurate retardance measurement," Appl. Opt. 36,6466-6472 (1997).
  7. D. B. Chenault and R. A. Chipman, "Measurements of linear diattenuation and linear retardance spectra with a rotating sample spectropolarimeter," Appl. Opt. 32, 3513-3519 (1993).
  8. L. Shyu, C. Chen, and D. Su, "Method for measuring the retardation of a wave plate," Appl. Opt. 32, 42 4228-4230 (1993).
  9. J. E. Hayden and S. D. Jacobs, "Automated spatially scanning ellipsometer for retardation measurements of transparent materials," Appl. Opt. 32, 6256-6263 (1993).
  10. H. Takasaki, M. Isobe, T. Masaki, A. Konda, I. Agatsuma, and Y. Watanabe, Appl. Opt. 3, 343-350 (1964).
  11. H. F. Hazebroek and A. A. Holscher, J Phys. E 6, 822-826 (1973).
  12. T. Oakberg, "Measurement of waveplate retardation using a photoelastic modulator," Proc. SPIE 3121, 19-22, (1997).
  13. K. B. Rochford and C. M. Wang, "Accurate interferometric retardance measurements," Appl. Opt. 36, 6473-6479 (1997).
  14. X. S. Yao, L. S. Yan, and Y. Shi, "Highly repeatable all-solid-state polarization-state generator," Opt. Lett. 30, 1324-1327 (2005)
  15. X. S. Yao, X. Chen, and L. S. Yan, "Self-calibrating binary polarization analyzer," Opt. Lett. 31, 1948-1950 (2006)
  16. M. Born and E. Wolf, Principle of optics: Electromagnetic theory of propagation, interference and diffraction of light, (7th Edition, University Press, Cambridge, UK, 1999).

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