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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 20 — Oct. 1, 2007
  • pp: 13318–13329

Optical characterization of extremely small volumes of liquid in sub-micro-holes by simultaneous reflectivity, ellipsometry and spectrometry

M. Holgado, R. Casquel, B. Sánchez, C. Molpeceres, M. Morales, and J. L. Ocaña  »View Author Affiliations

Optics Express, Vol. 15, Issue 20, pp. 13318-13329 (2007)

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We have fabricated and characterized a lattice of submicron cone-shaped holes on a SiO2/Si wafer. Reflectivity profiles as a function of angle of incidence and polarization, phase shift and spectrometry are obtained for several fluids with different refractive indexes filling the holes. The optical setup allows measuring in the center of a single hole and collecting all data simultaneously, which can be applied for measuring extremely low volumes of fluid (in the order of 0.1 femtolitres) and label-free immunoassays, as it works as a refractive index sensor. A three layer film stack model is defined to perform theoretical calculations.

© 2007 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(130.0130) Integrated optics : Integrated optics
(130.6010) Integrated optics : Sensors
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 11, 2007
Revised Manuscript: July 31, 2007
Manuscript Accepted: August 1, 2007
Published: September 28, 2007

Virtual Issues
Vol. 2, Iss. 11 Virtual Journal for Biomedical Optics

M. Holgado, R. Casquel, B. Sánchez, C. Molpeceres, M. Morales, and J. L. Ocaña, "Optical characterization of extremely small volumes of liquid in sub-micro-holes by simultaneous reflectivity, ellipsometry and spectrometry," Opt. Express 15, 13318-13329 (2007)

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