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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 20 — Oct. 1, 2007
  • pp: 13434–13445

Back-scattered detection provides atomic-scale localization precision, stability, and registration in 3D

Ashley R. Carter, Gavin M. King, and Thomas T. Perkins  »View Author Affiliations


Optics Express, Vol. 15, Issue 20, pp. 13434-13445 (2007)
http://dx.doi.org/10.1364/OE.15.013434


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Abstract

State-of-the-art microscopy techniques (e.g., atomic force microscopy, scanning-tunneling microscopy, and optical tweezers) are sensitive to atomic-scale (100 pm) displacements. Yet, sample drift limits the ultimate potential of many of these techniques. We demonstrate a general solution for sample control in 3D using back-scattered detection (BSD) in both air and water. BSD off a silicon disk fabricated on a cover slip enabled 19 pm lateral localization precision (Δf = 0.1–50 Hz) with low crosstalk between axes (≤3%). We achieved atomic-scale stabilization (88, 79, and 98 pm, in x, y, and z, respectively; Δf = 0.1–50 Hz) and registration (≈50 pm (rms), N = 14, Δt = 90 s) of a sample in 3D that allows for stabilized scanning with uniform steps using low laser power (1 mW). Thus, BSD provides a precise method to locally measure and thereby actively control sample position for diverse applications, especially those with limited optical access such as scanning probe microscopy, and magnetic tweezers.

© 2007 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:
Microscopy

History
Original Manuscript: August 14, 2007
Revised Manuscript: September 17, 2007
Manuscript Accepted: September 25, 2007
Published: September 28, 2007

Virtual Issues
Vol. 2, Iss. 11 Virtual Journal for Biomedical Optics

Citation
Ashley R. Carter, Gavin M. King, and Thomas T. Perkins, "Back-scattered detection provides atomic-scale localization precision, stability, and registration in 3D," Opt. Express 15, 13434-13445 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-20-13434


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