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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 21 — Oct. 17, 2007
  • pp: 13886–13893

Optical characterization of a GaAs/In0.5(AlxGa1-x)0.5P/GaAs heterostructure cavity by piezoreflectance spectroscopy

Ching-Hwa Ho, Ji-Han Li, and Yu-Shyan Lin  »View Author Affiliations


Optics Express, Vol. 15, Issue 21, pp. 13886-13893 (2007)
http://dx.doi.org/10.1364/OE.15.013886


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Abstract

Optical properties of a lattice matched GaAs/In0.5(AlxGa1-x)0.5P/GaAs heterostructure cavity have been characterized using piezoreflectance (PzR) measurements in the temperature range between 20 and 300 K. The measurements were carried out in the energy range of 1.3-6 eV. The PzR spectra of In0.5(AlxGa1-x)0.5P at 20 and 300K clearly show a lot of interband transition features present at energies above the band edge. There is also a feature of interference-fringes oscillations observed in each PzR spectrum below band gap E0 of In0.5(AlxGa1-x)0.5P. The oscillation period in between the PzR interference fringes can be utilized to determine the index of refraction (n) for the In0.5(AlxGa1-x)0.5P at different temperatures. The Al composition x of In0.5(AlxGa1-x)0.5P can be estimated from the evaluation value of E0 by PzR. The obtained Al composition of x=0.691 is in good agreements with the original design for growing the quaternary compound. Electronic band structure of In0.5(Al0.7Ga0.3)0.5P is determined by the interband transitions from PzR. The temperature variations of the transition energies and index of refraction n for the In0.5(AlxGa1-x)0.5P are analyzed discussed. The PzR is proven to be very sensitive in determining the optical parameters in III-V GaAs/InAlGaP/GaAs Fabry-Perot system.

© 2007 Optical Society of America

OCIS Codes
(160.4760) Materials : Optical properties
(300.6380) Spectroscopy : Spectroscopy, modulation
(300.6470) Spectroscopy : Spectroscopy, semiconductors

ToC Category:
Materials

History
Original Manuscript: July 17, 2007
Revised Manuscript: September 30, 2007
Manuscript Accepted: October 1, 2007
Published: October 8, 2007

Citation
Ching-Hwa Ho, Ji-Han Li, and Yu-Shyan Lin, "Optical characterization of a GaAs/In0.5(AlxGa1-x)0.5P/GaAs heterostructure cavity by piezoreflectance spectroscopy," Opt. Express 15, 13886-13893 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-21-13886


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