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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 22 — Oct. 29, 2007
  • pp: 14369–14375

Terahertz pulse reflective focal-plane tomography

Xinke Wang, Ye Cui, Wenfeng Sun, Yan Zhang, and Cunlin Zhang  »View Author Affiliations


Optics Express, Vol. 15, Issue 22, pp. 14369-14375 (2007)
http://dx.doi.org/10.1364/OE.15.014369


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Abstract

An effective terahertz (THz) imaging technology is presented for achieving tomographic image. A THz pulse reflective focal-plane imaging system is built up and the tomographic image of a metallic cross hidden by a high resistivity Si wafer is achieved. Using the reflected pulses from each interface, the thickness of each layer can be calculated with calculation error below 2.5%. This work demonstrates that the THz pulse focal-plane tomography can be used to analysis interior configuration of the object.

© 2007 Optical Society of America

OCIS Codes
(110.6960) Imaging systems : Tomography
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6270) Spectroscopy : Spectroscopy, far infrared

ToC Category:
Imaging Systems

History
Original Manuscript: August 13, 2007
Revised Manuscript: September 5, 2007
Manuscript Accepted: September 7, 2007
Published: October 16, 2007

Citation
Xinke Wang, Ye Cui, Wenfeng Sun, Yan Zhang, and Cunlin Zhang, "Terahertz pulse reflective focal-plane tomography," Opt. Express 15, 14369-14375 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-22-14369


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