Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy

doi:10.1364/OE.15.015782

Optics Express

Editor: C. Martijn de Sterke
Vol. 15, Iss. 24 — Nov. 26, 2007
pp: 15782–15796

Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy

Y. L. Lo and C. H. Chuang »View Author Affiliations

Optics Express, Vol. 15, Issue 24, pp. 15782-15796 (2007)
http://dx.doi.org/10.1364/OE.15.015782

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Abstract
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Abstract

Eliminating background-scattering effects from the detected signal is crucial in improving the performance of super-high-resolution apertureless scanning near-field optical microscopy (A-SNOM). Using a simple mathematical model of the A-SNOM detected signal, this study explores the respective effects of the phase modulation depth, the wavelength and angle of the incident light, and the amplitude of the tip vibration on the signal contrast and signal intensity. In general, the results show that the background-noise decays as the order of the Bessel function increases and that higher-order harmonic frequencies yield an improved signal contrast. Additionally, it is found that incident light with a longer wavelength improves the signal contrast for a constant order of modulation frequency. The signal contrast can also be improved by reducing the incident angle of the incident light. Finally, it is demonstrated that sample stage scanning yields an improved imaging result. However, tip scanning provides a reasonable low-cost and faster solution in the smaller scan area. The analytical results presented in this study enable a better understanding of the complex detected signal in A-SNOM and provide insights into methods of improving the signal contrast of the A-SNOM measurement signal.

OCIS Codes
(060.5060) Fiber optics and optical communications : Phase modulation
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Microscopy

History
Original Manuscript: October 29, 2007
Revised Manuscript: November 8, 2007
Manuscript Accepted: November 8, 2007
Published: November 13, 2007

Virtual Issues
Vol. 2, Iss. 12 Virtual Journal for Biomedical Optics

Citation
Y. L. Lo and C. H. Chuang, "Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy," Opt. Express 15, 15782-15796 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-24-15782

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References

E. H. Synge, "A suggested method for extending the microscopic resolution into the ultramicroscopic region," Phil. Mag. 6, 356-362 (1928).
G. Binnig and H. Rohrer, "Scanning tunneling microscopy," Helv. Phys. Acta. 55, 726-735 (1982).
G. Binnig, C. F. Quate, and C. Gerber, "Atomic force miscopy," Phys. Rev. Lett. 56, 930-933 (1986). [CrossRef] [PubMed]
D. W. Pohl, S. Denk, and M. Lanz, "Optical stethoscopy: image recording with resolution," J. Appl. Phys. 44, 651-653 (1984).
J. D. Jackson, Classical Electrodynamics (Wiley, 1999).
J. Wessel, "Surface-enhanced optical microscopy," J. Opt. Soc. Am. 2, 1538-1540 (1985). [CrossRef]
H. K. Wickramasinghe and C. C. Williams, "Apertureless near field optical microscope," US Patent 4, 947 034 (1990).
Y. Inouye and S. Kawata, "Near-field scanning optical microscope with a metallic probe tip," Opt. Lett. 19, 159-161 (1994). [CrossRef] [PubMed]
B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000). [CrossRef]
R. Hillenbrand and F. Keilmann, "Complex optical constants on a subwavelength scale," Phys. Rev. Lett. 85, 3029-3032 (2000). [CrossRef] [PubMed]
R. HillenbrandB. Knoll, and F. Keilmann, "Pure optical contrast in scattering-type scanning near-field microscopy," J. Microsc. 202, 77-83 (2000). [CrossRef]
I. Stefanon, S. Blaize, A. Bruyant, S Aubert, G. Lerondel, R. Bachelot, and P. Royer, "Heterodyne detection of guided waves using a scattering-type scanning near-field optical microscope," Opt. Express 13, 5553-5564 (2005). [CrossRef] [PubMed]
F. Keilmann and R. Hillenbrand, "Near-field microscopy by elastic light scattering from a tip," Phil. Trans. R. Soc. Lond. A. 362, 787-805 (2004). [CrossRef]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, "Influence of tip modulation on image formation in scanning near-field optical microscopy," J. Appl. Phys. 89, 5159-5169 (2001). [CrossRef]
S. Hudlet, S. Aubert, A. Bruyant, R. Bachelot, P. M. Adam, J. L. Bijeon, G. Lerondel, P. Royer, and A. A. Stashkevich, "Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of background field," Opt. Commun. 230, 245-251 (2004). [CrossRef]
P. G. Gucciardi, G. Bachelier, and M. Allegrini, "Far-field background suppression in tip-modulated apertureless near-field optical microscopy," J. Appl. Phys. 99, Art. No. 124309 (2006). [CrossRef]
Y.L Lo and C.H. Chuang, "New synthetic-heterodyne demodulation for an optical fiber interferometry," IEEE J. Quantum Electron 37, 658-663 (2001). [CrossRef]
M. Micic, N. Klymyshyn, Y. D. Sun, and H. P. Lu, "Finite element method simulation of the field distribution for AFM tip-enhanced surface Raman Scanning Microscopy," J. Phys. Chem. B. 107, 1574-1584 (2003).
A. Bek, Apertureless SNOM: a new tool for nano-optics, (Ph.D. Thesis, Max Planck Institute for Solid State Research, Germany, 2004).

Helv. Phys. Acta.

G. Binnig and H. Rohrer, "Scanning tunneling microscopy," Helv. Phys. Acta. 55, 726-735 (1982).

IEEE J. Quantum Electron

Y.L Lo and C.H. Chuang, "New synthetic-heterodyne demodulation for an optical fiber interferometry," IEEE J. Quantum Electron 37, 658-663 (2001). [CrossRef]

J. Appl. Phys.

J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, "Influence of tip modulation on image formation in scanning near-field optical microscopy," J. Appl. Phys. 89, 5159-5169 (2001). [CrossRef]
D. W. Pohl, S. Denk, and M. Lanz, "Optical stethoscopy: image recording with resolution," J. Appl. Phys. 44, 651-653 (1984).

J. Microsc.

R. HillenbrandB. Knoll, and F. Keilmann, "Pure optical contrast in scattering-type scanning near-field microscopy," J. Microsc. 202, 77-83 (2000). [CrossRef]

J. Opt. Soc. Am.

J. Wessel, "Surface-enhanced optical microscopy," J. Opt. Soc. Am. 2, 1538-1540 (1985). [CrossRef]

J. Phys. Chem. B.

M. Micic, N. Klymyshyn, Y. D. Sun, and H. P. Lu, "Finite element method simulation of the field distribution for AFM tip-enhanced surface Raman Scanning Microscopy," J. Phys. Chem. B. 107, 1574-1584 (2003).

Opt. Commun.

S. Hudlet, S. Aubert, A. Bruyant, R. Bachelot, P. M. Adam, J. L. Bijeon, G. Lerondel, P. Royer, and A. A. Stashkevich, "Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of background field," Opt. Commun. 230, 245-251 (2004). [CrossRef]
B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000). [CrossRef]

Opt. Express

I. Stefanon, S. Blaize, A. Bruyant, S Aubert, G. Lerondel, R. Bachelot, and P. Royer, "Heterodyne detection of guided waves using a scattering-type scanning near-field optical microscope," Opt. Express 13, 5553-5564 (2005). [CrossRef] [PubMed]

Opt. Lett.

Y. Inouye and S. Kawata, "Near-field scanning optical microscope with a metallic probe tip," Opt. Lett. 19, 159-161 (1994). [CrossRef] [PubMed]

Phil. Mag.

E. H. Synge, "A suggested method for extending the microscopic resolution into the ultramicroscopic region," Phil. Mag. 6, 356-362 (1928).

Phil. Trans. R. Soc. Lond. A.

F. Keilmann and R. Hillenbrand, "Near-field microscopy by elastic light scattering from a tip," Phil. Trans. R. Soc. Lond. A. 362, 787-805 (2004). [CrossRef]

Phys. Rev. Lett.

R. Hillenbrand and F. Keilmann, "Complex optical constants on a subwavelength scale," Phys. Rev. Lett. 85, 3029-3032 (2000). [CrossRef] [PubMed]
G. Binnig, C. F. Quate, and C. Gerber, "Atomic force miscopy," Phys. Rev. Lett. 56, 930-933 (1986). [CrossRef] [PubMed]

Other

J. D. Jackson, Classical Electrodynamics (Wiley, 1999).
H. K. Wickramasinghe and C. C. Williams, "Apertureless near field optical microscope," US Patent 4, 947 034 (1990).
P. G. Gucciardi, G. Bachelier, and M. Allegrini, "Far-field background suppression in tip-modulated apertureless near-field optical microscopy," J. Appl. Phys. 99, Art. No. 124309 (2006). [CrossRef]
A. Bek, Apertureless SNOM: a new tool for nano-optics, (Ph.D. Thesis, Max Planck Institute for Solid State Research, Germany, 2004).

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