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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 24 — Nov. 26, 2007
  • pp: 16210–16215

Experimental demonstration of a wafer-level flexible probe for optical waveguide testing

Abdullah J. Zakariya, Tao Liu, and Roberto R. Panepucci  »View Author Affiliations


Optics Express, Vol. 15, Issue 24, pp. 16210-16215 (2007)
http://dx.doi.org/10.1364/OE.15.016210


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Abstract

A flexible optical probe that accomplishes wafer-level directional coupling of light into optical waveguides is investigated theoretically and experimentally. Simulated results indicate high coupling efficiencies in excess of 80% for a range of parameters. Probe fabrication was implemented using SU8 as flexible waveguide material. Coupling of light from flexible probe to an S-shaped test waveguide demonstrated 11% efficiency compared to direct butt coupling. These results may lead to increased yield, shorter development cycles and overall savings in PLC packaging costs.

© 2007 Optical Society of America

OCIS Codes
(230.7370) Optical devices : Waveguides
(250.5530) Optoelectronics : Pulse propagation and temporal solitons

ToC Category:
Optical Devices

History
Original Manuscript: October 8, 2007
Revised Manuscript: November 16, 2007
Manuscript Accepted: November 20, 2007
Published: November 21, 2007

Citation
Abdullah J. Zakariya, Tao Liu, and Roberto R. Panepucci, "Experimental demonstration of a wafer-level flexible probe for optical waveguide testing," Opt. Express 15, 16210-16215 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-24-16210


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