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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 26 — Dec. 24, 2007
  • pp: 17805–17818

Lateral shearing interferometry: theoretical limits with practical consequences

M. Servin, M. Cywiak, and A. Dávila  »View Author Affiliations


Optics Express, Vol. 15, Issue 26, pp. 17805-17818 (2007)
http://dx.doi.org/10.1364/OE.15.017805


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Abstract

In this work we analyze the spatial frequency response, the spatial distribution and continuity of the recovered phase in Lateral Shearing Interferometry (LSI). The frequency content and the spatial topology of the recovered phase is analyzed for the forward LSI operator as well as its inverse LSI operator using one, two, or n two-dimensional sheared interferograms. The wavefront’s spatial frequency response of the lateral shearing interferometer is well known and for the reader’s convenience, it is briefly revisited in a new perspective. It is however less well-known and more interesting to analyze the spatial distribution of the lateral sheared data as well as the spatial topology of the recovered phase produced by some inverse LSI operators. Also we define a useful space of functions S with the property that any sheared data available, along any direction, may be used to recovered a smooth continuous phase with the bonus property of fully covering the pupil of the wavefront being tested. These combined aspects allow us to find the best possible wave-front reconstruction from the available sheared data using one, two or n sheared interferograms.

© 2007 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 17, 2007
Revised Manuscript: November 30, 2007
Manuscript Accepted: November 30, 2007
Published: December 13, 2007

Citation
Manuel Servin, Moises Cywiak, and Abundio Davila, "Extreme shearing interferometry: Theoretical limits with practical consequences," Opt. Express 15, 17805-17818 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-26-17805


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