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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 5 — Mar. 5, 2007
  • pp: 2075–2097

Rigorous 3D Calculation of Effects of Pit Structure in TwoDOS Systems

J. A. C. Veerman, A. J. H. Wachters, A. M. van der Lee, and H. P. Urbach  »View Author Affiliations

Optics Express, Vol. 15, Issue 5, pp. 2075-2097 (2007)

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A computer program based on the finite element method is used to study variations in pit visibility for a pit structure that is similar to those used in TwoDOS systems. It is concluded that pit visibility is best enhanced by making the pit width larger, and that destructive interference by making pit depth d Poly /4 (where λ Poly is the wavelength in Polycarbonate) does not play a major role. Also, pit visibility depends strongly on the thickness of the Al layer. The simulations are compared with experiments and with a scalar model.

© 2007 Optical Society of America

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording
(260.1960) Physical optics : Diffraction theory

ToC Category:
Diffraction and Gratings

Original Manuscript: June 14, 2006
Revised Manuscript: August 25, 2006
Manuscript Accepted: August 28, 2006
Published: March 5, 2007

J. A. Veerman, A. J. Wachters, A. M. van der Lee, and H. P. Urbach, "Rigorous 3D calculation of effects of pit structure in TwoDOS systems," Opt. Express 15, 2075-2097 (2007)

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  1. X. Wei, A. J. H. Wachters and H. P. Urbach: "Finite element model for three-dimensional optical storage problem," to be published.
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