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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 5 — Mar. 5, 2007
  • pp: 2075–2097

Rigorous 3D Calculation of Effects of Pit Structure in TwoDOS Systems

J. A. C. Veerman, A. J. H. Wachters, A. M. van der Lee, and H. P. Urbach  »View Author Affiliations


Optics Express, Vol. 15, Issue 5, pp. 2075-2097 (2007)
http://dx.doi.org/10.1364/OE.15.002075


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Abstract

A computer program based on the finite element method is used to study variations in pit visibility for a pit structure that is similar to those used in TwoDOS systems. It is concluded that pit visibility is best enhanced by making the pit width larger, and that destructive interference by making pit depth d Poly /4 (where λ Poly is the wavelength in Polycarbonate) does not play a major role. Also, pit visibility depends strongly on the thickness of the Al layer. The simulations are compared with experiments and with a scalar model.

© 2007 Optical Society of America

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording
(260.1960) Physical optics : Diffraction theory

ToC Category:
Diffraction and Gratings

History
Original Manuscript: June 14, 2006
Revised Manuscript: August 25, 2006
Manuscript Accepted: August 28, 2006
Published: March 5, 2007

Citation
J. A. Veerman, A. J. Wachters, A. M. van der Lee, and H. P. Urbach, "Rigorous 3D calculation of effects of pit structure in TwoDOS systems," Opt. Express 15, 2075-2097 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-5-2075


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References

  1. X. Wei, A. J. H. Wachters and H. P. Urbach: "Finite element model for three-dimensional optical storage problem," to be published.
  2. J. M. Brok and H. P. Urbach, "Rigorous model of the scattering of a focussed spot by a grating, and its application in optical recording," J. Opt. Soc. Am. A 20256-272 (2003). [CrossRef]
  3. see e.g. P. G. Ciarlet, "The Finite Element Method for Elliptic Problems," SIAM 2002.
  4. X. Wei, H. P. Urbach, A. Wachters and Y. Aksenov: "3D Rigorous simulation of mask induced polarization," to be published.
  5. W. M. J. Coene, D. M. Bruls, A. H. J. Immink, A. M. van der Lee, A. P. Hekstra, J. Riani, S. van Beneden, M. Ciacci, J. W. M. Bergmans, M. Furuki, "Two-dimensional Optical Storage," IEEE Proceedings of the International Conference on Acoustics, Speed and Signal Processing 5, 749-752 (2005).
  6. W. M. J. Coene, "Nonlinear Signal-Processing Model for Scalar Diffraction in Optical Recording," Appl. Opt. 42, 6525-6535 (2003) [CrossRef] [PubMed]
  7. L. Fagoonee, W. M. J. Coene, A. Moinian, and B. Honary, "Nonlinear signal-processing model for signal generation in multilevel two-dimensional optical storage," Opt. Lett.,  29, 385-387 (2004) [CrossRef] [PubMed]
  8. J. D. Jackson, Classical Electrodynamics (Wiley, 1975)mj
  9. J. P. Berenger, "A perfectly matched layer for the absorption of electromagnetic waves," J. Comput. Phys 114, 185-200 (1994). [CrossRef]
  10. http://www.sara.nl/userinfo/reservoir/sepran/index.html
  11. J. Nedelec, "Mixed finite elements in R3," Numer. Math. 35, 315-341 (1980). [CrossRef]
  12. Y. Saad, " Iterative methods for sparse linear systems," SIAM, 2nd edition, 2003.
  13. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, 1996).
  14. DIFFRACT is a product of MM Research Inc. Tucson Ariz. Its theoretical basis has been described in, e.g. M.Mansuripur, "Certain computational aspects of vector diffraction problems," J. Opt. Soc. Am. 6, 786-805 (1989). [CrossRef]
  15. J. van Bladel, Singular Electromagnetic Fields and Sources (Oxford 1991).

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