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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 7 — Apr. 2, 2007
  • pp: 3804–3815

Faithful non-linear imaging from only-amplitude measurements of incident and total fields

Lorenzo Crocco, Michele D’Urso, and Tommaso Isernia  »View Author Affiliations

Optics Express, Vol. 15, Issue 7, pp. 3804-3815 (2007)

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Applicability of inverse scattering based imaging procedures can be broadened by developing new approaches exploiting only amplitude data. As a matter of fact, this can open the way to simpler and less expensive measurement set-ups. In this respect, a two-step based procedure for solving electromagnetic nonlinear inverse scattering problems from only amplitude measurements of the total field has been recently proposed [1,2]. However, in these latter both amplitude and phase of the incident field are still required. In this contribution, we show the possibility of achieving this information from the measured amplitude distribution of the incident field on the observation domain. In particular, a three steps imaging technique which exploits only amplitude measurements of the total and incident fields has been developed. The proposed procedure has been tested against benchmark experimental data available in the literature. The obtained results fully confirm the possibility of achieving faithful reconstructions of unknown targets without performing any phase measurements and any approximation on the scattering equations involved in the inverse scattering problems.

© 2007 Optical Society of America

OCIS Codes
(100.3190) Image processing : Inverse problems
(100.5070) Image processing : Phase retrieval
(100.6950) Image processing : Tomographic image processing
(290.3200) Scattering : Inverse scattering

ToC Category:
Image Processing

Original Manuscript: November 10, 2006
Revised Manuscript: February 5, 2007
Manuscript Accepted: February 16, 2007
Published: April 2, 2007

Lorenzo Crocco, Michele D'Urso, and Tommaso Isernia, "Faithful non-linear imaging from only-amplitude measurements of incident and total fields," Opt. Express 15, 3804-3815 (2007)

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