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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 8 — Apr. 16, 2007
  • pp: 4445–4451

Optical constant determination of an anisotropic thin film via polarization conversion

Yi-Jun Jen, Cheng-Yu Peng, and Heng-Hao Chang  »View Author Affiliations


Optics Express, Vol. 15, Issue 8, pp. 4445-4451 (2007)
http://dx.doi.org/10.1364/OE.15.004445


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Abstract

This study presents a simple method for determining the optical constants of an anisotropic thin film. The sensitivity of enhanced polarization conversion reflectance to optical constants is also calculated and analyzed. Based on the sensitivity calculation, the principal indices and columnar tilt angle can be derived from the polarization conversion reflectance angular spectrum.

© 2007 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(230.5440) Optical devices : Polarization-selective devices
(260.1440) Physical optics : Birefringence
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 11, 2007
Revised Manuscript: March 22, 2007
Manuscript Accepted: March 24, 2007
Published: April 3, 2007

Citation
Yi-Jun Jen, Cheng-Yu Peng, and Heng-Hao Chang, "Optical constant determination of an anisotropic thin film via polarization conversion," Opt. Express 15, 4445-4451 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-8-4445


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References

  1. I. J. Hodgkinson and Q. H. Wu, Birefringent Thin Films and Polarizing Elements (World Scientific, USA, 1997). [CrossRef]
  2. I. J. Hodgkinson and Q. H. Wu, "Anisotropic antireflection coatings: design and fabrication," Opt. Lett. 23, 1553-1555 (1998). http://www.opticsinfobase.org/abstract.cfm?id=36983 [CrossRef]
  3. I. J. Hodgkinson, Q. H. Wu, L. D. Silva and M. Arnold, "Inorganic positive uniaxial films fabricated by serial bideposition," Opt. Express 12, 3840-3847 (2004). [CrossRef] [PubMed]
  4. Y. J. Jen and C.Y. Peng, "Narrow-band and broad-band polarization conversion reflection filters," Appl. Phys. Lett. 89, 041128 (2006). http://apl.aip.org/apl/top.jsp [CrossRef]
  5. F. Horowitz, Structure-Induced Optical Anisotropy in Thin Film (PhD dissertation, University of Arizona, Optical Sciences Center, 1983).
  6. H. Wang, "Reflection/transmission measurements of anisotropic films with one of the principal axes in the direction of columnar growth," J. Mod. Opt. 42, 497-505 (1995). http://web.ebscohost.com/ehost/detail?vid=1&hid=6&sid=cda59d34-b4ff-4fd6-ae6a-8a417dca0258%40sessionmgr7 [CrossRef]
  7. F. Flory, D. Endelema, E. Pelletier and I. Hodgkinson, "Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO2 films," Appl. Opt. 32, 5649-5659 (1993). http://www.opticsinfobase.org/abstract.cfm?id=60976 [CrossRef] [PubMed]
  8. Y. J. Jen, C. H. Hsieh and T. S. Lo, "Optical constant determination of an anisotropic thin film via surface plasmon resonance: analyzed by sensitivity calculation," Opt. Commun. 224, 269-277 (2005). http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TVF-4DGD4JP-1&_user=4462129&_coverDate=01%2F03%2F2005&_alid=514382637&_rdoc=1&_fmt=full&_orig=search&_cdi=5533&_sort=d&_st=4&_docanchor=&_acct=C000053837&_version=1&_urlVersion=0&_userid=4462129&md5=af91299e67249853b95193f09c220403 [CrossRef]
  9. M. Schubert and W. Dollase, "Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb_2 S_3," Opt. Lett. 27, 2073-2075 (2002). http://www.opticsinfobase.org/abstract.cfm?id=70604 [CrossRef]
  10. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North Holland, Amsterdam, 1979).
  11. Y. J. Jen and C. L. Chiang, "Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients," Opt. Eng. 45, 023802 (2006). http://scitation.aip.org/journals/doc/OPEGAR-ft/vol_45/iss_2/023802_1.html [CrossRef]
  12. F. Yang and J. R. Sambles, "Optical characterization of a uniaxial material by the polarization-conversion reflectivity technique," J. Opt. Soc. Am. B 11, 605-617 (1994). http://www.opticsinfobase.org/abstract.cfm?id=7357 [CrossRef]
  13. D. W. Berreman, "Optics in Stratified and Anisotropic Media: 4X4-Matrix Formulation," J. Opt. Soc. Am. 62, 502-510 (1972). http://www.opticsinfobase.org/abstract.cfm?id=54639 [CrossRef]
  14. I. Hodgkinson, Q. H. Wu and J. Hazel, "Empirical Equations for the Principal Refractive Indices and Column Angle of Obliquely Deposited Films of Tantalum Oxide, Titanium Oxide, and Zirconium Oxide," Appl. Opt. 37, 2653-2659 (1998). http://www.opticsinfobase.org/abstract.cfm?id=43685 [CrossRef]

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