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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 8 — Apr. 16, 2007
  • pp: 4745–4752

An optical fiber-taper probe for wafer-scale microphotonic device characterization

C. P. Michael, M. Borselli, T. J. Johnson, C. Chrystal, and O. Painter  »View Author Affiliations


Optics Express, Vol. 15, Issue 8, pp. 4745-4752 (2007)
http://dx.doi.org/10.1364/OE.15.004745


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Abstract

A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the “dimpled” taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3×106) and a planar microring (Q = 4.8×106).

© 2007 Optical Society of America

OCIS Codes
(060.2300) Fiber optics and optical communications : Fiber measurements
(230.5750) Optical devices : Resonators
(230.7370) Optical devices : Waveguides

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: February 9, 2007
Revised Manuscript: March 15, 2007
Manuscript Accepted: March 19, 2007
Published: April 4, 2007

Citation
C. P. Michael, M. Borselli, T. J. Johnson, C. Chrystal, and O. Painter, "An optical fiber-taper probe for wafer-scale microphotonic device characterization," Opt. Express 15, 4745-4752 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-8-4745


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