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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 8 — Apr. 16, 2007
  • pp: 4787–4794

Needle-based reflection refractometry of scattering samples using coherence-gated detection

Adam M. Zysk, Daniel L. Marks, Dianna Y. Liu, and Stephen A. Boppart  »View Author Affiliations

Optics Express, Vol. 15, Issue 8, pp. 4787-4794 (2007)

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We present a novel method for in situ refractive index measurement of scattering samples using a needle device. The device employs a fiber-based reflectance refractometer and coherence-gated detection of the reflected optical signal that eliminates scattering-dependent backreflection contributions. Additionally, birefringence changes induced by fiber movement are neutralized by randomizing the source polarizations and averaging the measured Fresnel reflection coefficients over many incident polarization states. Experimental measurements of Intralipid scattering solutions are presented and compared with Monte Carlo simulations.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5710) Instrumentation, measurement, and metrology : Refraction
(160.4760) Materials : Optical properties
(290.3030) Scattering : Index measurements

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 16, 2007
Revised Manuscript: April 1, 2007
Manuscript Accepted: April 2, 2007
Published: April 5, 2007

Adam M. Zysk, Daniel L. Marks, Dianna Y. Liu, and Stephen A. Boppart, "Needle-based reflection refractometry of scattering samples using coherence-gated detection," Opt. Express 15, 4787-4794 (2007)

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