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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 15, Iss. 8 — Apr. 16, 2007
  • pp: 5136–5146

Near field behavior of SnO2 particle-layer deposited on standard optical fiber by electrostatic spray pyrolysis method

A. Cusano, P. Pilla, M. Consales, M. Pisco, A. Buosciolo, and M. Giordano  »View Author Affiliations


Optics Express, Vol. 15, Issue 8, pp. 5136-5146 (2007)
http://dx.doi.org/10.1364/OE.15.005136


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Abstract

We report the emergent optical near field profiles from standard single mode optical fibers on the cleaved end of which were deposited particle layers of SnO2. The layers, composed of micron and sub-micron sized particles, were deposited by means of Electrostatic Spray Pyrolysis (ESP) technique. Powerful analytical tools such as Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) were used to obtain simultaneously the SnO2 layers topography and the related optical near field intensity distribution, when the fiber-substrate is illuminated by a light radiation in NIR range. We show that isolated microstructures, positioned in correspondence of the fiber core, reveal highly unusual capability of locally enhancing the collected optical near field. The observed phenomenon leads to new concepts of fiber optic chemical sensors and in fiber microsystems as well.

© 2007 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(180.5810) Microscopy : Scanning microscopy
(230.3990) Optical devices : Micro-optical devices
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: September 26, 2006
Revised Manuscript: November 8, 2006
Manuscript Accepted: November 10, 2006
Published: April 12, 2007

Citation
A. Cusano, P. Pilla, M. Consales, M. Pisco, A. Cutolo, A. Buosciolo, and M. Giordano, "Near field behavior of SnO2 particle-layer deposited on standard optical fiber by electrostatic spray pyrolysis method," Opt. Express 15, 5136-5146 (2007)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-15-8-5136


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