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Optics Express

Optics Express

  • Editor: C. Martijin de Sterke
  • Vol. 15, Iss. 9 — Apr. 30, 2007
  • pp: 5451–5459

Optical functionalities of dielectric material deposits obtained from a Lambertian evaporation source

J. M. González-Leal  »View Author Affiliations

Optics Express, Vol. 15, Issue 9, pp. 5451-5459 (2007)

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The thickness profile of deposits obtained from Lambertian evaporation sources is highlighted concerning its transmission optical functionality, in the case of dielectric materials. Fresnel diffraction is used to characterize the lateral resolution and intensity on the optical axis of an input gaussian laser beam. Functionality similar to logarithmic axicons, with uniform lateral resolution and also uniform on-axis intensity, is theoretically derived. It is also shown for this particular optical structure that the intensity slope along the optical axis can be changed from positive to negative values by only changing the input beam width.

© 2007 Optical Society of America

OCIS Codes
(220.1250) Optical design and fabrication : Aspherics
(310.1860) Thin films : Deposition and fabrication

ToC Category:
Optical Design and Fabrication

Original Manuscript: February 6, 2007
Revised Manuscript: February 27, 2007
Manuscript Accepted: March 24, 2007
Published: April 20, 2007

J. M. González-Leal, "Optical functionalities of dielectric material deposits obtained from a Lambertian evaporation source," Opt. Express 15, 5451-5459 (2007)

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