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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 1 — Jan. 7, 2008
  • pp: 179–193

Moiré profilometry using liquid crystals for projection and demodulation

Jan A.N. Buytaert and Joris J.J. Dirckx  »View Author Affiliations


Optics Express, Vol. 16, Issue 1, pp. 179-193 (2008)
http://dx.doi.org/10.1364/OE.16.000179


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Abstract

A projection moiré profilometer is presented in which both projection and optical demodulation are realized with liquid crystal light modulators. The computer generated grids, realized on thin film transistor matrices, allow phase-stepping and discrete grid averaging without the need for any mechanically moving component. Spatial line pitch and phase steps can thus be readily adjusted to suit the measurement precision and object geometry. The device is able to perform topographic measurements with a height resolution of 15µm on every pixel of the recording device.

© 2008 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(230.0250) Optical devices : Optoelectronics

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 23, 2007
Revised Manuscript: November 26, 2007
Manuscript Accepted: November 27, 2007
Published: January 2, 2008

Citation
Jan A. N. Buytaert and Joris J. J. Dirckx, "Moiré profilometry using liquid crystals for projection and demodulation," Opt. Express 16, 179-193 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-1-179


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