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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 1 — Jan. 7, 2008
  • pp: 213–218

Study on readout durability of super-RENS disk

Qian Liu, Toshio Fukaya, Sihai Cao, Chuanfei Guo, Zhuwei Zhang, Yanjun Guo, Jinsong Wei, and Junji Tominaga  »View Author Affiliations


Optics Express, Vol. 16, Issue 1, pp. 213-218 (2008)
http://dx.doi.org/10.1364/OE.16.000213


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Abstract

Characteristics essential for the readout durability of a superresolution near-field structure (super-RENS) disk are studied experimentally by using a home-built optical measuring setup and atomic force microscope, based on a simplified PtO x super-RENS disk. The experimental results show that for a super-RENS disk with constant structure and materials, readout signals including transmittance and reflectance vary with changes in bubble shape and size, indicating that the readout durability of the disk has a strong dependence on bubble stability, which is closely related to the thickness of the cover layer, the recording power and readout power, and the mechanical properties of the dielectric layer. Based on our experimental results, the main direction for improving readout durability is also proposed.

© 2008 Optical Society of America

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(210.4245) Optical data storage : Near-field optical recording

ToC Category:
Optical Data Storage

History
Original Manuscript: November 1, 2007
Revised Manuscript: December 3, 2007
Manuscript Accepted: December 4, 2007
Published: January 2, 2008

Citation
Qian Liu, Toshio Fukaya, Sihai Cao, Chuanfei Guo, Zhuwei Zhang, Yanjun Guo, Jingsong Wei, and Junji Tominaga, "Study on readout durability of super-RENS disk," Opt. Express 16, 213-218 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-1-213


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References

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