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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 6785–6793

Structured illumination for the extension of imaging interferometric microscopy

Alexander Neumann, Yuliya Kuznetsova, and S. R. Brueck  »View Author Affiliations


Optics Express, Vol. 16, Issue 10, pp. 6785-6793 (2008)
http://dx.doi.org/10.1364/OE.16.006785


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Abstract

Structured illumination applied to imaging interferometric microscopy (IIM) allows extension of the resolution limit of low numerical aperture objective lenses to ultimate linear systems limits (<~λ/4 in air) without requiring a reference beam around the objective lens. Instead, the reference beam is provided by an illumination beam just at the edge of the optical system numerical aperture resulting in a shift of the recorded spatial frequencies (equivalent to an intermediate frequency). The restoration procedure is discussed. This technique is adaptable readily to existing microscopes, since extensive access to the imaging system pupil plane is not required.

© 2008 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(110.3175) Imaging systems : Interferometric imaging

ToC Category:
Microscopy

History
Original Manuscript: January 22, 2008
Revised Manuscript: April 17, 2008
Manuscript Accepted: April 18, 2008
Published: April 28, 2008

Virtual Issues
Vol. 3, Iss. 6 Virtual Journal for Biomedical Optics

Citation
Alexander Neumann, Yuliya Kuznetsova, and S. R. Brueck, "Structured illumination for the extension of imaging interferometric microscopy," Opt. Express 16, 6785-6793 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-6785


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References

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