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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 16, Iss. 10 — May. 12, 2008
  • pp: 6889–6895

A polarization-modulation method for the near-field mapping of laterally grown InGaN samples.

Ruggero Micheletto, Daisuke Yamada, Maria Allegrini, and Yoichi Kawakami  »View Author Affiliations


Optics Express, Vol. 16, Issue 10, pp. 6889-6895 (2008)
http://dx.doi.org/10.1364/OE.16.006889


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Abstract

Epitaxial Laterally overgrown (ELOG) InGaN materials are investigated using a polarization modulated scanning near-field optical microscope. The authors found that luminescence has spatial inhomogeneities and it is partially polarized. Near-field photoluminescence shows polarization phase fluctuation up to 45 degrees over adjacent domains. These results point toward the existence of asymmetries in carrier confinement due to structural anisotropic strain within the framework of the ELOG structure.

© 2008 Optical Society of America

OCIS Codes
(130.5990) Integrated optics : Semiconductors
(250.5230) Optoelectronics : Photoluminescence
(180.4243) Microscopy : Near-field microscopy
(240.5440) Optics at surfaces : Polarization-selective devices

ToC Category:
Optoelectronics

History
Original Manuscript: February 8, 2008
Revised Manuscript: March 28, 2008
Manuscript Accepted: April 5, 2008
Published: April 30, 2008

Citation
Ruggero Micheletto, Daisuke Yamada, Maria Allegrini, and Yoichi Kawakami, "A polarization-modulation method for the near-field mapping of laterally grown InGaN samples," Opt. Express 16, 6889-6895 (2008)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-16-10-6889


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References

  1. S.�Nakamura, "The roles of structural imperfections in InGaN-based blue light emittind diodes and Lasers Diodes," Science�281, 956-961 (1998). [CrossRef]
  2. A.�Usui, H.�Sunakawa, A.�Sakai, and A. A.�Yamaguchi, "Thick GaN epitaxial growth with low dislocation density by hydride vapor phase epitaxy," Jpn. J. Appl. Phys.�36, L899-L902 (1997). [CrossRef]
  3. T. S.�Zheleva, O. H.�Nam, M. D.�Bremser, and R. F.�Davis, "Dislocation density reduction via lateral epitaxy in selectively grown GaN structures," Appl. Phys. Lett.�71, 2472-2474 (1997). [CrossRef]
  4. M. D.�Craven, S. H.�Lim, F.�Wu, J. S.�Speck, and S. P.�DenBaars, "Threading dislocation reduction via laterally overgrown nonpolar (11(2)over-bar0) a-plane GaN," Appl. Phys. Lett.�81, 1201-1203 (2002). [CrossRef]
  5. O.�Stier, M.�Grundmann, and D.�Bimberg, "Electronic and optical properties of strained quantum dots modeled by 8-band k center dot p theory," Phys. Rev. B�59, 5688-5701 (1999). [CrossRef]
  6. M.�Matthews, J.�Hsu, S.�Gu, and T.�Kuech, "Carrier density imaging of lateral epitaxially overgrown GaN using scanning confocal Raman microscopy," Appl. Phys. Lett.�79, 3086-3088 (2001). [CrossRef]
  7. J.�Hsu, M.�Matthews, D.�Abusch-Magder, R.�Kleiman, D.�Lang, S.�Richter, S.�Gu, and T.�Kuech, "Spatial variation of electrical properties in lateral epitaxially overgrown GaN," Appl. Phys. Lett.�79, 761-763 (2001). [CrossRef]
  8. A.�Kaneta, M.�Funato, Y.�Narukawa, T.�Mukai, and Y.�Kawakami, "Direct correlation between nonradiative recombination centers and threading dislocations in InGaN quantum wells by near-field photoluminescence spectroscopy," Phys. Status Solidi C�3, 1897-1901 (2006). [CrossRef]
  9. R.�Micheletto, Y.�Kawakami, C.�Manfredotti, Y.�Garino, and M.�Allegrini, "Dichroism of diamond grains by a polarization modulated near field optical setup," Appl. Phys. Lett.�89, 121125 (2006). [CrossRef]
  10. P. G.�Gucciardi, M.�Allegrini, R.�Micheletto, T.�Kotani, T.�Hatada, and Y.�Kawakami, "Waveguide behavior of Distributed Bragg Reflectors probed by polarization-modulated near-field optical microscopy," J. Korean Phys. Soc.�47, S101-S108 (2005).
  11. B.�Bhushan and H.�Fuchs, eds., Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (Springer, 2005).
  12. R.�Micheletto, M.�Allegrini, and Y.�Kawakami, "Artifacts in Polarization Modulation Scanning Near-field Optical Microscopes," J. Opt. A�9, 431-434 (2007). [CrossRef]
  13. S.�Mononobe and M.�Ohtsu, "Development of a fiber used for fabricating application oriented near-field optical probes," IEEE Photon. Technol. Lett.�10, 99-101 (1998). [CrossRef]
  14. S.�Mononobe, M.�Naya, T.�Saiki, and M.�Ohtsu, "Reproducible fabrication of a fiber probe with a nanometric protrusion for near-field optics," Appl. Opt.�36, 1496-1500 (1997). [CrossRef] [PubMed]
  15. T.�Matsumoto, T.�Ichimura, T.�Yatsui, M.�Kourogi, T.�Saiki, and M.�Ohtsu, "Fabrication of a near-field optical fiber probe with a nanometric metallized protrusion," Opt. Rev.�5, 369-373 (1998). [CrossRef]

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